Nanotechnology Products, Applications & Instruments
Showing results 41 - 60 of 93 for companies in category Analysis in USA:
The company develops innovative measurement and control technologies for researchers studying the physical properties of metals and ceramics at very low temperatures. Typical materials that can be measured include nanoscale electronics, quantum wires and dots, organic and dilute magnetic semiconductors, superconductors, and spintronics devices.
LDB Corp provides metrology instruments to industrial component and semiconductor companies.
LightForm develops and sells hyperspectral imaging instrumentation to life science researchers.
Masscal Scientific Instruments is dedicated to the development, distribution and application of laboratory instruments which utilize core patented technologies for the simultaneous measurements of mass, heat flow and viscoelasticity of thin films and similar samples undergoing reactions within precisely controlled environments.
LASAW analytical instrument - laser actuated surface acoustic wave analysis of thin film materials. Analysis of physical/mechanical properties such as hardness, density, and elasticity of thin film materials down to the meso/nano level thickness.
Manufacturer of laser particle size measurement instruments.
MikroMasch supplies a wide range of AFM probes, calibration gratings and other accessories for scanning probe microscopes.
Develops and manufactures the world's highest resolution Atomic Force Prober (AFP).
Nano Discovery Inc. is a manufacturer of dynamic light scattering (DLS) instruments. The company develops innovative applications using DLS. DLS has been traditionally used mainly for nanoparticle size characterization. By introducing gold nanoparticle probes, the firm developed a unique technology, NanoDLSay (Nanoparticle-Enabled Dynamic Light Scattering Assay)?, for chemical and biological detection and analysis.
A supplier for a variety of AFM systems, probes, accessories, and related nanoscience tools.
NanoSpective specializes in advanced materials characterization. The company uses cutting edge technology and state of the art equipment to perform nanoscale and macroscopic property evaluation of materials.
Nanotech America (NTA) is the distributor of the family of Scanning Probe Microscopes manufactured by NT-MDT (Zelenograd, Russia).
A microscopy and software company delivering rapid testing and analysis solutions to sectors ranging from materials science, and semiconductors to life science and medicine.
Nanounity supplies surface science analytical solutions through a range of synergistic products through partnerships with leading instrumentation manufacturers. Their core technologies are microscopy, metrology and spectroscopy.
Nanovea manufactures Profilometers, Mechanical Testers & Tribometers to combine the most advanced testing capabilities in the industry: Scratch/Adhesion, Indentation/Hardness, Wear/Friction & 3D Non-Contact Metrology at Nano, Micro & Macro range. Unlike other manufactures Nanovea also provides Laboratory Services, offering clients availability to the latest technology and optimal results through improvements in testing standards.
Develops Scanning Probe Position Encoder (SPPE) technology.
The company has developed a breakthrough nanofabrication technology to grow constant diameter, silver-gallium (Ag2Ga) nanoneedles, at any preferred location (e.g. SPM Probe tips) and orientation.
Nikon Metrology offers a complete range of metrology solutions including Coordinate Measuring Machines(CMMs), Optical CMMs, 3D laser scanners, X-ray and Computed Tomography (CT), Optical CNC measuring systems , Laser Radar, iGPS /iSpace systems, and metrology software for 3D scanning, 3D digitizing, 3D inspection and reverse engineering.
Specializes in advanced electron optics, especially the optics of very-high resolution electron microscopes.
Develops and produces innnovative and state of the art devices that facilitate nanotechnology projects. These improvements range from specialized AFM instruments to the probes and sensors used to characterize samples.