Nanotechnology Products, Applications & Instruments
Showing results 81 - 93 of 93 for companies in category Analysis in USA:
Skyray XRF is the North American representative of Skyray Instrument, Inc. Established in 1990, Skyray Instrument, Inc specializes in X-Ray Fluorescence spectrometer (XRF) research, development, production and sales.
Spectradyne LLC is commercializing a revolutionary method of measuring sub-micron nanoparticles. Applications include characterizing nanomedicine delivery systems, the measurement of protein aggregation in the drug development industry, virology and in consumer product quality control.
Supplier of microscopy instruments and manufacturer of sample preparation equipment, consumable supplies, accessories for microscopy and microanalysis laboratories.
Develops spectroscopy, lasers, and imaging instruments.
Ted Pella, Inc ia a leading manufacturer of consumables, supplies, tools and specimen preparation equipment for all disciplines of microscopy and nanotechnology. Specialized in specimen mounts and holders for SEM, FIB, support films and grids for TEM, calibrations standards and sample storage.
Thermo Scientific supplies analytical instrumentation, lab equipment, automation technologies, reagents and consumables, and LIMS solutions, including spectrometers suited for nanotechnology.
TrueGage specializes in both off-the-shelf and custom software development for the surface and dimensional metrology industries.
TSI Incorporated designs and manufactures precision instruments used to measure flow, particulate, and other key parameters in environments the world over.
XOS® has been a leading global provider of advanced X-ray optics for material analysis systems since the optics' commercial introduction in the mid-1990s. The systems are important for essentially all industries that use materials – from cement to semiconductor to pharmaceutical to petroleum – measuring aspects such as semiconductor film thickness, stress in turbine blades, groundwater contamination, and contaminant levels.
Manufactures nanodevices based on individual carbon nanotubes (CNTs) and CNT arrays with well-controlled properties using a proprietary, scalable core process - CNT based probes for high-end microscopy tools, including CNT tips for Atomic Force Microscopes (AFMs); CNT field emitters for Scanning Electron Microscopes (SEMs).
XiGo Nanotools' range of particle characterization products provides measurements of particle size, particle size distribution, and surface area. XiGo Nanotools also offers contract testing, consulting, or training in particle characterization.
Major products include: carbon nanotube(CNT)-based field emission electron source, field emission grade CNT material, field emission x-ray source and CNT AFM probes.
Zeta Instruments' Focus Map technology brings 3-D imaging and metrology capabilities to your microscope.