Scanning probe microscopes

Scanning Probe Microscopes (SPM) include Atomic Force Microscopes (AFM) and Scanning Tunneling Microscopes (STM or STEM). They are the only instruments in widespread use that can actually "see" single atoms! You can skim this webpage quickly to learn the general concepts of SPM's, or you can read carefully and almost be ready to operate one!
  Category: Metrology
  Source: The University of Virginia Virtual Lab