Posted: May 11, 2009

Ion Beam Cross-sectioning of Oil shale and Solar Panel Thin Films

(Nanowerk News) A new e-brochure from JEOL illustrates the application of an ion beam cross section polisher for SEM sample preparation of solar panel thin films and kerogen-rich shale samples.
e-brochure from JEOL
The new e-brochure from JEOL
The online brochure includes SEM images as well as movie and 3D files of complex shale composites and EBSD orientation maps of solar panel thin films. The JEOL cross section polisher produces cross sections without smearing, crumbling, or distortion - ideal for preparing difficult samples.
Cross section of kerogen rich shale (false color SEM image)
Cross section of kerogen rich shale (false color SEM image)
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.
Source: JEOL (press release)
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