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Posted: June 8, 2009
FRT Presents New Affordable Optical Tool for Non-Contact Film Thickness Measurements
(Nanowerk News) FRT presents a new
optical film thickness measuring tool at this year's Laser 2009 in Munich. The new MicroSpy FT non-destructively
measures coatings that transparent or semi-transparent in the visible and
near-infrared spectrum of light.
The easy to use film thickness measuring tool is cost-effective and
powerful at the same time. With its innovative 3D film thickness mapping
mode, the tool allows the thickness measurement of entire coating areas to
visualize and evaluate the evenness of film thickness distribution as well as
classical point and profile measurements on the coating. Furthermore,
self-supported films such as foils, single films or stacked films on a
substrate can be characterized. The tool is used in research and quality control of innovative products in the fields of medical-, semiconductor- and microsystem technology (MST) as well as in photovoltaics, optics and the
According to the given measurement task, the new FRT MicroSpy FT is
equipped with a fast interferometric or reflectometric film thickness sensor.
A selection of nine different sensor types with various light sources,
measuring spot sizes and thickness measuring ranges offer great flexibility
for the measurement of all kinds of coating materials and coating thicknesses
from a few millimeters down to 10 nanometers.
The new tool is very easy to use with minimum training required. Its
integrated CCD-camera with illumination provides a live camera picture of the
measuring area directly in the software. Sample positioning is done with the
click of a mouse button through a motorized precision table with a travel
range of 50 mm x 50 mm. To put the sensor in perfect focus, FRT has included
a high-precision z-axis with micrometer resolution that is usually found in
only the very highest quality optical microscopes.
To find out more about the new film thickness measuring tool MicroSpy FT,
visit FRT at this year's Laser 2009 in hall B2, booth 443!