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Posted: April 9, 2010
Presenting In-line Particle Sizing for High Shear Granulation
(Nanowerk News) At the Advances in Process Analytics and Control Technology 2010 Conference (APACT 10; 28-30 April 2010, Manchester, UK), Malvern Instruments process systems specialist Jarvis Jeejing will give a presentation of in-line particle size analysis for high shear granulation processes. He will introduce the technique of particle velocimetry for in-line particle size measurement, focusing on its application to the control and optimisation of high shear granulation processes within the pharmaceutical industry. Mr Jeejing’s presentation will form part of a session on Thursday 29 April dedicated to industrial applications of process analysis. Malvern will also participate in the associated trade exhibition.
Particle velocimetry, exemplified in the Parsum inline particle probe (IPP70) from Malvern Instruments, is a technique that is suitable for measuring particles in the size range 50 to 6000 microns, travelling at velocities of between 0.01 and 50 m/s. This makes it ideal for monitoring processes such as granulation, spray drying, fluidised bed and particle size reduction.
The importance of granulation in pharmaceutical manufacturing is well established, where it is used widely to improve the flow properties and consistency of tableting blends, as well as for other properties. High shear (or wet) granulation delivers high throughput and dense, uniform, dust-free granules, but its optimisation can be challenging. Continuous monitoring offers a valuable approach.
APACT 10 is an open forum for the presentation and discussion of recent advances in engineering and scientific topics relevant to process analytics and control technologies. Plenary and keynote speakers will describe the formulation and implementation of PAC strategies, review the benefits that can be achieved, and report recent developments. The conference is open to all interested participants and will provide opportunities for academics and industrialists to present their knowledge and research to an informed multidisciplinary audience. The programme will include contributed lectures, poster presentations and a vendor exhibition. The meeting is an ideal forum for networking and information gathering on PAC. Those new to process analysis or process control will benefit from the friendly atmosphere that typifies an APACT conference. www.apact.co.uk