Posted: April 28, 2010

Veeco's Sharp Nitride Lever Probes Enable Superior Resolution in AFM Imaging

(Nanowerk News) Veeco Instruments Inc., a leading provider of scanning probe microscopes (SPM) to the nanoscience community, now manufactures new Sharp Nitride Lever (SNL) Probes that provide breakthrough atomic force microscope (AFM) imaging resolution and longer probe lifetimes, without higher expenses.
Veeco's Sharp Nitride Lever Probe
Veeco's Sharp Nitride Lever Probe
The AFM community has long desired a silicon nitride lever with a sharper tip for imaging in fluids. Veeco’s revolutionary hybrid SiN/Si manufacturing process has enabled the realization of this goal by combining the low spring constant softness of a silicon nitride cantilever with the sharpness of a silicon tip. This process has dramatically improved the traditional probe radii limits of 10 to 20 nanometers to a radius of curvature as low as 2 nanometers. These probes have already delivered unprecedented high-resolution imaging in both air and fluid with Contact Mode and TappingMode™ operation.
Other features worth mentioning:
  • The new SNL Probes can be used on any AFM instrument
  • Two configurations are available, NP/DNP levers and MLCT/MSCT levers
  • The silicon tips can be functionalized easily for molecular recognition and other advanced applications
  • The SNL Probes are available immediately at In addition to the new SNL Probes, Veeco manufactures and sells the world’s most complete line of probes and accessories for current and next-generation AFM applications, including tips customized for electrical and magnetic applications, nanoindentation, and nearly every other advanced AFM technique. For more information about Veeco’s probes and accessories, please email [email protected], or call +1 (805) 388-3326, x2080.
    Source: Veeco (press release)
    Subscribe to a free copy of one of our daily
    Nanowerk Newsletter Email Digests
    with a compilation of all of the day's news.
    These articles might interest you as well: