National Government Standards Lab Selects JEOL Atomic Resolution Microscope for R+D

(Nanowerk News)JEOL announces a major order for the company's atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM), from the National Institute of Standards and Technology (NIST). The purchase was made through a competitive award process and funded by the American Recovery and Reinvestment Act. The TEM will be a featured instrument in the NIST Precision Measurement Laboratory, Boulder, Colorado.
"We are very excited to be partnering with this premier federal government facility and are confident the opportunity will recognize the high performance capability of this new TEM platform," said Peter Genovese, JEOL USA President. "We believe having hands-on access will open up unexplored horizons and world-class results for the scientific team who will be using it."
JEOL JEM-ARM200F Atomic Resolution TEM
JEOL JEM-ARM200F Atomic Resolution TEM.
The ARM200F, introduced in 2009, has set a new benchmark for advanced aberration-corrected S/TEM technology with the highest resolution (78pm) commercially available in its class. The instrument represents more than 60 years of TEM expertise at JEOL and was designed from the ground up to integrate aberration correction into a super-shielded electron column that safeguards the ultrahigh-powered optics from environmental interferences.
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.JEOL USA, Inc., is a wholly owned subsidiary of JEOL, Ltd., Japan, was incorporated in the United States in 1962. The company has 13 regional service centers that offer unlimited emergency service and support in the U.S.
Source: JEOL USA (press release)
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