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Posted: Dec 14, 2010
WITec Introduces 'True Surface Microscopy'
(Nanowerk News) WITec, a leader in nano-analytical microscopy systems, has launched the
new True Surface Microscopy option. The core element of this revolutionary imaging
mode is an integrated sensor for optical profilometry. Large-area topographic
coordinates from the profilometer measurement can be precisely correlated with the
large-area confocal Raman imaging data. This allows for the first time confocal
Raman imaging along heavily inclined or very rough samples with the true surface
held in constant focus while maintaining the highest confocality.
With the new
imaging mode, samples that had previously required extensive preparation in order to
obtain a certain surface flatness can now be effortlessly and automatically
characterized as they are. Complete system control as well as extensive data
evaluation are integrated within the WITec Control and WITec Project software
environment, guaranteeing renowned ease-of-use.
"The integrated combination of optical profilometry and large-area confocal Raman
imaging is the next evolutionary leap in cutting-edge microscope configurations."
says Dr. Olaf Hollricher, WITec managing director R&D. "Only an inherently modular
instrument design can enable such a seamless incorporation of a groundbreaking
and complementary imaging technique into the present product line of Raman-AFM
The profilometry capabilities of True Surface Imaging mode allows scan ranges of up
to 50x100 mm with a spatial resolution on the order of 100 nm vertically and 10 3m
laterally. Measuring distances of 10 mm and more provide flexibility for variable
sample size requirements. In combination with AFM, the profilometer can even be
used as a pre-inspection tool to determine topographic features of interest for highresolution
AFM investigations on large samples. The overall performance and
exceptionally accurate imaging capabilities of True Surface Microscopy are beneficial
for many applications, including the characterization of micromechanical, medical, or
semiconductor devices, the mapping of functionalized surfaces, or the imaging of biomedical
or pharmaceutical material surface properties.
WITec is a manufacturer of high performance optical and scanning probe microscopy
systems. A modular product line allows the combination of different microscopy
techniques such as Raman, SNOM or AFM in a single instrument for flexible analysis
of the optical, chemical and structural properties of a sample. The instruments are
distributed worldwide and are used primarily in the fields of Materials Science, Life
Science and Nanotechnology. WITec is based in Ulm, Germany with regional
headquarters in Maryville, TN, USA and Singapore. For more information, please visit