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Posted: May 7, 2008
Nanometrics Acquires Assets of Tevet Process Control Technologies
(Nanowerk News) Nanometrics Incorporated (Nasdaq:NANO), a leading supplier of advanced process control metrology equipment, today announced that it has acquired Tevet Process Control Technologies, Ltd. (“Tevet”) through an all-cash asset purchase transaction. Tevet is an integrated metrology (“IM”) company serving the worldwide semiconductor and solar manufacturing industry.
The acquisition of Tevet furthers Nanometrics’ strategy to offer a breadth of process control metrology solutions that address both advanced technology as well as cost of ownership. With this acquisition, Nanometrics adds the industry’s highest-throughput excursion monitoring IM product to its portfolio of metrology solutions. “The new IM products are differentiated and highly complementary to our IM business,” commented Steve Bradley, Director of the Integrated Metrology Business Unit at Nanometrics. “This represents an additional entry point for us with leading semiconductor OEMs, as well as companies in the solar manufacturing industry.”
The acquisition is expected to be accretive in 2008.
Nanometrics is a leader in the design, manufacture and marketing of high-performance process control metrology systems used in semiconductor manufacturing. Nanometrics standalone and integrated metrology systems measure various thin film properties, critical dimensions, overlay control and optical, electrical and material properties, including the structural composition of silicon and compound semiconductor devices, during various steps of the manufacturing process. These systems enable semiconductor manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Market under the symbol NANO. Nanometrics’ website is http://www.nanometrics.com.