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Posted: June 2, 2008
Veeco Introduces HarmoniX
(Nanowerk News) Veeco Instruments Inc. (Nasdaq: VECO), a leading provider of instrumentation to the nanoscience community, today introduced HarmoniX™, a powerful new atomic force microscope (AFM) technique for high-resolution nanoscale imaging and analysis. Veeco's HarmoniX Nanoscale Material Property Mapping enables AFM users to simultaneously, and in real-time, acquire high-resolution images as well as high-resolution, quantitative material property maps. The HarmoniX mode is now available on all Veeco scanning probe microscopes that are powered by the new NanoScope® V controller, including the MultiMode® V, Dimension™ V, and BioScope™ II.
David Rossi, Vice President, General Manager of Veeco's Nano-Bio AFM Business, commented, "HarmoniX is a significant breakthrough in SPM technology and opens the door to quantitative material property characterization at speeds and levels of resolution previously impossible. Our product scientists and engineering team collaborated with Dr. Ozgur Sahin, of the Rowland Institute at Harvard, to develop and bring this new patented technique to market. Thousands of publications have referenced Veeco's AFMs, and we believe that HarmoniX, available exclusively from Veeco, represents a major leap forward to enable our customers' further scientific discoveries."
Dr. Bede Pittenger, Veeco Development Scientist, added, "HarmoniX provides an AFM user the ability to simultaneously capture quantitative maps of material properties, such as elasticity, adhesion, dissipation and peak force. The HarmoniX technique renders these maps at speeds that are orders of magnitude greater than currently-available force techniques, with the same level of high resolution our customers are accustomed to with Veeco's TappingMode™."
Veeco's NanoScope V microscope controller and proprietary probes provide the speed, signal levels, and processing power necessary to render high-resolution data never before seen in real time. HarmoniX acquires real-time force curves by measuring the cantilever's torsional and flexural motion each time the AFM tip interacts with the surface in TappingMode. Proprietary algorithms instantly calculate the force curves that occur when the tip taps the surface, and analyze them to obtain multiple sample characteristics. These material properties are then rendered in image maps that correlate to the sample topography image. These maps are quantitative and directly traceable to the Elastic Modulus of the sample being imaged. To learn more about HarmoniX, and to see a video of how it works, please visit http://www.veeco.com/harmonix-pr.
Veeco Instruments Inc. manufactures enabling solutions for customers in the HB-LED, solar, data storage, semiconductor, scientific research and industrial markets. We have leading technology positions in our three businesses: LED & Solar Process Equipment, Data Storage Process Equipment, and Metrology Instruments. Veeco's manufacturing and engineering facilities are located in New York, New Jersey, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the U.S., Europe, Japan and APAC. http://www.veeco.com/