Posted: October 21, 2008

Ambios Technology Introduces New Q-View White Light Interferometer/SPM

(Nanowerk News) Ambios Technology, Inc. introduced its new Q-View White Light Interferometer / SPM system at the Twenty-Third Annual Meeting of the American Society for Precision Engineering in Portland, Oregon. This new system combines the capability of white light interferometry and SPM technology.
The Q-View Interferometric Module integrates seamlessly onto the Q-Scope SPM platform. Q-View uses optical profiler technology to render and measure a large area (500┬Ám) in a few seconds. Switch to SPM mode and characterize surface structures at the sub-angstrom level. Rick Olds, Sales and Marketing Manager of Ambios Technology, commented, "The synergy of combining SPM and Interferometer technology on a single platform will greatly enhance surface imaging and metrology for the community of SPM users."
Q-View White Light Interferometer / SPM is provided as a fully integrated system with the benefits of two technologies on one unified platform. In addition, the Q-View Interferometer module is available as an upgrade for existing Q-Scope customers.
Ambios Technology, Inc. is a manufacturer of high resolution surface measurement and visualization systems. In addition to surface profilometers, the company manufactures scanning white light interferometers and (AFM/SPM) scanning probe microscopes. A privately held company, Ambios Technology, is headquartered in Santa Cruz, CA with a sales, service, and support office in Rochester, NY.
Source: Ambios Technology (press release)
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