Posted: March 25, 2009

Instruments + Software + Standards = New Solutions From PANalytical

(Nanowerk News) Leading analytical X-ray company PANalytical (Almelo, the Netherlands) will reinforce its reputation for complete solutions at this year’s ACHEMA conference and exhibition (11 - 15 May 2009; Frankfurt am Main, Germany).
Visitors to hall 6.3, booth J21-K23, will experience innovative 3-D interactive product simulations showcasing the Axios range of XRF spectrometers. Omnian, PANalytical’s new standardless XRF analysis package for the rapid quantification of unknown samples, makes its European exhibition debut, and the company will also feature one of its flexible, cost-effective application-specific MiniPal systems. The instrumentation, software and standards packages will demonstrate complete solutions for elemental analysis in the cement, mining, metals, pharmaceutical, chemical, plastics and oil industries.
A wide range of PANalytical XRD hardware and software will also be on show. With applications as diverse as pharmaceuticals and nanomaterials, the X’Pert PRO multi-purpose X-ray diffractometer will be featured. Visitors can test PANalytical’s unique PreFIX system for the rapid exchange of all optical components without the need for realignment. The X’Pert PRO system allows an unmatched range of geometries, from the traditional Bragg-Brentano to an ultra-fast transmission high-throughput system with the revolutionary PIXcel detector. It can also accommodate a SAXS setup. Flexible XRD software covers phase analysis, stress and thin film analysis, high-end cluster analysis and small-angle scattering, for example.
PANalytical experts will be on hand to demonstrate the company’s analytical X-ray solutions, and discuss your specific application challenges.
Source: PANalytical (press release)
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