EDAX Increases Speed and Productivity of its Electron Backscatter Diffraction Cameras

(Nanowerk News) EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has announced a more than 25 percent increase in the performance of its Hikari XP and Digiview EBSD cameras while maintaining their industry-best indexing quality.
Hikari XP (top) and DigiView IV EBSD cameras
Hikari XP (top) and DigiView IV EBSD cameras.
Hikari XP EBSD Cameras
The Hikari XP camera now delivers up to 1000 patterns per second. The camera offers outstanding performance across the complete range of EBSD applications, from high-speed analysis for process development and quality control to high-sensitivity indexing at low beam currents and low accelerating voltages for improved spatial resolution.
Providing results without compromise, the Hikari XP blends market-leading speed, sensitivity and precision in one camera. When paired with EDAX’s TEAM™ EBSD software, the Hikari XP offers the highest indexing success rates on the market, guaranteeing the user the best possible data quality.
The new Hikari XP delivers high-end performance in both speed and sensitivity, encompassing all EBSD applications. In addition to the speed improvements and low beam current performance, the highly versatile Hikari XP sets the bar for precision with the capability to measure orientations with accuracy down to 0.1 degree.
“Previously, a user had to decide between a high-speed camera and a high-sensitivity camera. With the Hikari XP camera, a compromise between speed and sensitivity is no longer required,” comments Mike Coy, Technical Product Manager for Microanalysis. “Now, the Hikari XP not only successfully indexes 1,000 patterns per second at a 99% indexing rate under typical EBSD conditions but also provides outstanding sensitivity, allowing operation down to the 100 pA range of beam current while still maintaining a 99% indexing rate.”
DigiView IV EBSD Cameras
The EDAX DigiView camera offers excellent performance over a wide range of EBSD applications, providing the same indexing success rates and orientation precision values as the Hikari XP, while delivering speeds up to 200 indexed points per second. When paired with EDAX TEAM™ software, this high-resolution camera enables users to obtain outstanding results from both routine and advanced analyses and provides a flexible solution that guarantees the best possible data quality and insight into all materials characterization needs.
EDAX is the acknowledged leader in Energy Dispersive Microanalysis, Electron Backscatter Diffraction and X-ray Fluorescence instrumentation. EDAX designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets. Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements. EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical devices with annualized sales of $3.5 billion.
Source: EDAX (press release)
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