NanoWorld Arrow™ AFM probes are designed for easy tip positioning and high-resolution AFM imaging. They fit to all well-known commercial SPMs (Scanning Probe Microscopes) and AFMs (Atomic Force Microscopes). The AFM probe consists of an AFM probe support chip with an AFM cantilever which has a tetrahedral AFM tip at its triangular free end.
The AFM probe is entirely made of monolithic, highly doped silicon.
The unique Arrow™ shape of the AFM cantilever and the position of the AFM tip at the very end of the cantilever allows easy positioning of the AFM tip on the area of interest.
The special AFM tip shape leads to very symmetric scans.
The following types of conductive ARROW AFM probes with a PlatinumIridium Coating are available:

ARROW-CONTPt ( often used in Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM)):
Typical force constant: 0.2 N/m
Typical resonance frequency: 14 kHz

ARROW-EFM (designed for applications in Electrostatic Force Microscopy ):
Typical force constant: 2.8 N/m
Typical resonance frequency: 75 kHz

ARROW-NCPt:
Typical force constant: 42 N/m
Typical resonance frequency: 285 kHz

AFM probes of Arrow™ AFM probe series also include:
Tapping mode AFM probes, contact mode AFM probes, High-Speed AFM probes ( ARROW-UHF ) and a range of tipless AFM cantilevers and AFM cantilever arrays.
Please contact us to find out more or have a look at: https://www.nanoworld.com/arrow-afm-tips