Contact Mode AFM Probes
- Price:
- Request a Quote
- Vendor:
- NanoWorld AG
- Country:
- Switzerland | Contact Details
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NanoWorld Pointprobe® Silicon SPM probes are the most widely used and best-known SPM and AFM probe world-wide.
The Pointprobe® series offers contact mode AFM cantilevers in three different types:
CONT - standard contact mode
Typical force constant: 0.2 N/m
Typical resonance frequency: 13 kHz
CONTSC – contact mode – short cantilever
Typical force constant: 0.2 N/m
Typical resonance frequency: 25 kHz
ZEILR – contact mode – originally developed for Zeiss and Seiko
Typical force constant: 1.6 N/m
Typical resonance frequency: 27 kHz
Please contact us to find out more or have a look at:
https://www.nanoworld.com/pointprobe-afm-tips -
NanoWorld™ is the world market leader for innovative high-quality probes for Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). The many kinds of SPM probes with various tip shapes and coatings offered by NanoWorld™ are used by researchers as well as in industrial applications.
NanoWorld’s main product series are:
- the Pointprobe® Silicon AFM probes series, the most widely used and best-know SPM and AFM probe series worldwide
- the Arrow™ Silicon AFM probes series – with an AFM tip at the very end at the cantilever offering optimized positioning through maximized tip visibility
- the Pyrex-Nitride ( PNP ) Silicon Nitride AFM tips series, these AFM probes are mainly used in biological applications and feature cantilevers and tips made from Silicon Nitride
- the Ultra Short Cantilever Series with very high resonance frequencies which is used for High Speed AFM and video rate AFM applications in air and in liquid
In our regularly updated NanoWorld blog you can find many application examples for our AFM probes.
Please have a look at the “how to buy” page on our webpage to find the contact details of your local distributor.
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