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  • Pyrex-Nitride (PNP) Silicon-Nitride AFM Probes
  • Pyrex-Nitride (PNP) Silicon-Nitride AFM Probes
  • Pyrex-Nitride (PNP) Silicon-Nitride AFM Probes

Pyrex-Nitride (PNP) Silicon-Nitride AFM Probes

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  • Nanoworld Sales,NanoWorld AG
  • Pyrex-Nitride (PNP) Silicon-Nitride AFM Probes
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  • NanoWorld AG
  • Nanoworld Sales
  • Rue des Saars 10
  • Neuchâtel
  • N/A
  • Switzerland
  • N/A
  • https://www.nanoworld.com/afm-probes-series
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  • Nanoworld Sales,NanoWorld AG
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  • NanoWorld® Pyrex-Nitride AFM probes are designed for various imaging applications in contact or dynamic mode/tapping mode AFM. They fit to all well-known commercial SPMs (Scanning Probe Microscopes) and AFMs (Atomic Force Microscopes).

    The NanoWorld® Pyrex-Nitride ( PNP) AFM probes consist of silicon nitride AFM cantilevers andsilicon nitride AFM tips supported by an AFM support chip made of pyrex-glass.

    Currently the following versions of the PNP AFM probe series are available:

    PNP-DB - Silicon Nitride AFM probes with two different rectangular AFM cantilevers on one support chip, gold reflex coating on the detector side of the cantilever:

    Typical force constant cantilever beam 1 ( CB1): 0.48 N/m
    Typical resonance frequency cantilever beam 1 (CB1): 67 kHz

    Typical force constant cantilever beam 2 (CB2): 0.06 N/m
    Typical resonance frequency cantilever beam 2 (CB2): 17 kHz



    PNP-TR – Silicon Nitride AFM probes with two different triangular AFM cantilevers on one support chip, gold reflex coating on the detector side of the cantilever:

    Typical force constant cantilever beam 1 ( CB1): 0.32 N/m
    Typical resonance frequency cantilever beam 1 (CB1): 67 kHz

    Typical force constant cantilever beam 2 (CB2): 0.08 N/m
    Typical resonance frequency cantilever beam 2 (CB2): 17 kHz



    PNP-TR-Au – Silicon Nitride AFM probes with two different triangular AFM cantilevers on one support chip, gold reflex coating on the detector side of the cantilever, gold coating on the tip side of the cantilever:

    Typical force constant cantilever beam 1 ( CB1): 0.32 N/m
    Typical resonance frequency cantilever beam 1 (CB1): 67 kHz

    Typical force constant cantilever beam 2 (CB2): 0.08 N/m
    Typical resonance frequency cantilever beam 2 (CB2): 17 kHz



    PNP-TRS – Silicon Nitride AFM probes with one single triangular AFM cantilever compatible with PeakForce Tapping™* and ScanAsyst®* Mode in Air:

    Typical force constant: 0.32 N/m
    Typical resonance frequency: 67 kHz

    Tipless versions of the triangular PNP probes are also available.

    Please contact us to find out more or have a look at: https://www.nanoworld.com/pyrex-nitride-silicon-nitride-afm-tips



    ( *PeakForce Tapping™ and ScanAsyst® are registered trademarks of Bruker Corporation)

  • NanoWorld™ is the world market leader for innovative high-quality probes for Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). The many kinds of SPM probes with various tip shapes and coatings offered by NanoWorld™ are used by researchers as well as in industrial applications.

    NanoWorld’s main product series are:

    - the Pointprobe® Silicon AFM probes series, the most widely used and best-know SPM and AFM probe series worldwide

    - the Arrow™ Silicon AFM probes series – with an AFM tip at the very end at the cantilever offering optimized positioning through maximized tip visibility

    - the Pyrex-Nitride ( PNP ) Silicon Nitride AFM tips series, these AFM probes are mainly used in biological applications and feature cantilevers and tips made from Silicon Nitride

    - the Ultra Short Cantilever Series with very high resonance frequencies which is used for High Speed AFM and video rate AFM applications in air and in liquid

    In our regularly updated NanoWorld blog you can find many application examples for our AFM probes.

    Please have a look at the “how to buy” page on our webpage to find the contact details of your local distributor.


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