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Low resolution versions of our general purpose AC mode silicon AFM probes, suitable for non-contact/tapping modes in air, on hard samples and stable softer samples. Ideal for step height measurements and training new users, where price is more important than tip sharpness.
Spring constant: 42 N/m
Resonant frequency: 350 kHz
Available with or without an Al reflex backside coating. -
NuNano is a UK-based company specialising in the design and manufacture of probes for atomic force microscopy (AFM) and cantilever-based sensor devices. NuNano manufactures AFM probes with the tightest dimensional tolerances in the market at present.
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