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General purpose AC mode silicon AFM probes with a high aspect ratio tip. Ideal for deep trench imaging with non-contact/soft tapping and force modulation modes in air, on softer samples.
Spring constant: 2 N/m
Resonant frequency: 70 kHz
High aspect ratio: Cone angle of < 15 ° over the final 1 μm of the tip
Available with or without Al reflex backside coating. -
NuNano is a UK-based company specialising in the design and manufacture of probes for atomic force microscopy (AFM) and cantilever-based sensor devices. NuNano manufactures AFM probes with the tightest dimensional tolerances in the market at present.
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