Product: Analytical Instrumentation

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X-ray Diffraction

  • Vendor:
  • Angstrom Advanced
  • Country:
  • United States

Ellipsometer

  • Vendor:
  • Angstrom Advanced
  • Country:
  • United States

Scanning Electron Microscope

  • Vendor:
  • Angstrom Advanced
  • Country:
  • United States

Hysitron TI 950

  • Vendor:
  • Bruker Nano Surfaces
  • Country:
  • United States

Hysitron TI 980

  • Vendor:
  • Bruker Nano Surfaces
  • Country:
  • United States

UMT TriboLab Mechanical Tester

  • Vendor:
  • Bruker Nano Surfaces
  • Country:
  • United States

Hysitron BioSoft™ In-Situ Indenter

  • Vendor:
  • Bruker Nano Surfaces
  • Country:
  • United States

Hysitron TriboScope

  • Vendor:
  • Bruker Nano Surfaces
  • Country:
  • United States

IntraSpect™ 360

  • Vendor:
  • Bruker Nano Surfaces
  • Country:
  • United States

Hysitron PI 85L SEM PicoIndenter

  • Vendor:
  • Bruker Nano Surfaces
  • Country:
  • United States

Hysitron TI Premier

  • Vendor:
  • Bruker Nano Surfaces
  • Country:
  • United States

Hysitron PI 88 SEM PicoIndenter

  • Vendor:
  • Bruker Nano Surfaces
  • Country:
  • United States

Hysitron PI 95 TEM PicoIndenter

  • Vendor:
  • Bruker Nano Surfaces
  • Country:
  • United States

DektakXT Stylus Profiler

  • Vendor:
  • Bruker Nano Surfaces
  • Country:
  • United States

Contour CMM Dimensional Analysis System

  • Vendor:
  • Bruker Nano Surfaces
  • Country:
  • United States

MuVi-SPIM

  • Vendor:
  • Bruker Nano Surfaces
  • Country:
  • United States

InVi-SPIM

  • Vendor:
  • Bruker Nano Surfaces
  • Country:
  • United States

Spectrophotometer System

  • Vendor:
  • ColVisTec
  • Country:
  • Germany

Color Probe (CP)

  • Vendor:
  • ColVisTec
  • Country:
  • Germany

Reflection Polymer Melt Probe (RPMP)

  • Vendor:
  • ColVisTec
  • Country:
  • Germany

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