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IEEE International Electron Devices Meeting issues a Call for Papers
(Nanowerk News) The 61st annual IEEE International Electron Devices Meeting (IEDM) has issued a Call for Papers seeking the world’s best original work in all areas of microelectronics research and development. The paper submission deadline is Monday, June 22, 2015 at 23:59 p.m. Pacific Time.
Overall, the 2015 IEDM is seeking increased participation in the areas of ‘Beyond CMOS’ devices, flexible devices, neuromorphic computing, power devices, sensors for the Internet of Things (IoT) and variation/reliability.
In addition, Special Focus Sessions will be held on the following topics: neural-inspired architectures; 2D materials and applications; flexible electronics and applications; power devices and reliability on non-native substrates; and silicon-based nanodevices for detection of biomolecules.
The 2015 IEDM will take place at the Washington, DC Hilton Hotel from December 7-9, 2015, preceded by a collection of 90-minute afternoon Tutorial sessions on Saturday, Dec. 5, and a full day of Short Courses on Sunday, Dec. 6. On Wednesday the conference will continue the successful Entrepreneurs Luncheon sponsored by IEDM and EDS Women in Engineering.
At IEDM each year, the world’s best scientists and engineers in the field of microelectronics from industry, academia and government gather to participate in a technical program of more than 220 presentations, along with a special Luncheon Presentation on Tuesday, Dec. 8 and a variety of panels, special sessions, Short Courses, IEEE/EDS award presentations and other events spotlighting more leading work in more areas of the field than any other conference.
Papers in the following areas are encouraged:
  • – Circuit and Device Interaction
  • – Characterization, Reliability and Yield
  • – Display and Imaging Systems
  • – Memory Technology<
  • – Modeling and Simulation
  • – Nano Device Technology
  • – Power and Compound Semiconductor Devices
  • – Process and Manufacturing Technology
  • – Sensors, MEMS and BioMEMS
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    Source: IEEE