- – Circuit and Device Interaction
- – Characterization, Reliability and Yield
- – Display and Imaging Systems
- – Memory Technology<
- – Modeling and Simulation
- – Nano Device Technology
- – Power and Compound Semiconductor Devices
- – Process and Manufacturing Technology
- – Sensors, MEMS and BioMEMS
| Posted: May 12, 2015 | |
IEEE International Electron Devices Meeting issues a Call for Papers |
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| (Nanowerk News) The 61st annual IEEE International Electron Devices Meeting (IEDM) has issued a Call for Papers seeking the world’s best original work in all areas of microelectronics research and development. The paper submission deadline is Monday, June 22, 2015 at 23:59 p.m. Pacific Time. | |
| Overall, the 2015 IEDM is seeking increased participation in the areas of ‘Beyond CMOS’ devices, flexible devices, neuromorphic computing, power devices, sensors for the Internet of Things (IoT) and variation/reliability. | |
| In addition, Special Focus Sessions will be held on the following topics: neural-inspired architectures; 2D materials and applications; flexible electronics and applications; power devices and reliability on non-native substrates; and silicon-based nanodevices for detection of biomolecules. | |
| The 2015 IEDM will take place at the Washington, DC Hilton Hotel from December 7-9, 2015, preceded by a collection of 90-minute afternoon Tutorial sessions on Saturday, Dec. 5, and a full day of Short Courses on Sunday, Dec. 6. On Wednesday the conference will continue the successful Entrepreneurs Luncheon sponsored by IEDM and EDS Women in Engineering. | |
| At IEDM each year, the world’s best scientists and engineers in the field of microelectronics from industry, academia and government gather to participate in a technical program of more than 220 presentations, along with a special Luncheon Presentation on Tuesday, Dec. 8 and a variety of panels, special sessions, Short Courses, IEEE/EDS award presentations and other events spotlighting more leading work in more areas of the field than any other conference. | |
| Papers in the following areas are encouraged: | |
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| Source: IEEE | |
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