Posted: August 24, 2010

Additional speakers add new dimensions to Particle Summit program

(Nanowerk News) Organisers of the two-day Particle Summit, which takes place near Boston in October (October 20-21, 2010; The Charles Hotel, Cambridge MA), have announced two further speakers for the event, adding to an already packed program:

– Dr Joerg Bolze from analytical X-ray company PANalytical will discuss 'Nanoparticle size distribution determination by small-angle X-ray scattering on a multi-purpose X-ray diffractometer platform'. He will include a short introduction to the SAXS technique together with application examples illustrating its potential and limitations for liquid nanoparticle dispersions, nano-powders, and nanocomposites.

– Alon Vaisman from Malvern Instruments will present 'Particle sizing - a proven technology for process control' in which he will describe how implementing on-line laser diffraction and real-time process control can maximize efficiency and eliminate out-of-spec production.

These additions to the program bring the number of speakers over the two days to seventeen, who between them will cover a wide range of particle characterization topics and technologies.

The event also features an optional pre-conference workshop on October 19 where participants can learn or refresh their knowledge of the basic principles of particle characterization.

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