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New issue of IBM Journal of Research and Development focuses on nanoscience and nanotechnology
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(Nanowerk News) IEEE, the world's largest technical professional association, announced that the July/August issue of IBM Journal of Research and Development has been published and appears exclusively in the IEEE Xplore® digital library. IBM Journal of Research & Development is the #1 most-cited journal in computer science, hardware and software, according to the 2010 Thomson Reuters Journal Citation Reports, released in June 2011
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This edition focuses on nanoscience, with an emphasis on LEEM (low-energy electron microscopy), PEEM (photoelectron emission microscopy), and related methods. LEEM is a technique used by scientists to study surfaces, atom-surface interactions, and thin crystalline films, while PEEM makes use of variations in electron emission to produce image contrast. The technologies have implications for the future of analytical nanoscience far beyond traditional cathode lens microscopy.
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The issue also promotes and discusses applications of cathode lens microscopy for a broad audience and highlights the most recent scientific advances, as well as instrumental developments. Topics include:
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thin film and organic films;M
surface chemistry;
magnetism;
time-resolved methods;
instrumental advances, and
novel applications of LEEM and PEEM.
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For more information or to learn how to subscribe, please visit www.ieee.org/go/ibmjournal.
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About IBM Journal of Research and Development
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IBM Journal of Research & Development was launched in 1957 by Thomas J. Watson Jr., IBM president and CEO, who viewed it as "a strong indication of the increasing emphasis we at IBM want to place in the future on fundamental science and technology." In 1962, the IBM Systems Journal was added to report advances in software, software systems and services, and today has merged with IBM Journal of Research & Development.
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