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NT-MDT Participated at the Joint ISFD-11th-RCBJSF Symposium

NT-MDT participated in the Joint International ISFD-11th-RCBJSF symposium combining 11th International Symposium on Ferroic Domains and Micro- to Nanoscopic Structures (ISFD-11), and 11th Russia/CIS/Baltic/Japan Symposium on Ferroelectricity (RCBJSF-11) simultaneously with International Youth Conference "High resolution microscopy" that all were held in the Ural Federal University in Russia.

Sep 18th, 2012

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Veeco IBD System Achieves Breakthrough Defect Reduction in EUV Mask Blanks

Veeco Instruments Inc. announced today that SEMATECH, a global semiconductor consortium that conducts research and development to advance chip manufacturing, has recently achieved a major breakthrough using Veeco's NEXUS Low Defect Density Ion Beam Deposition (LDD IBD) System to significantly reduce defects from multi-layer deposition of mask blanks used for extreme ultraviolet lithography (EUVL).

Sep 14th, 2012

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