At the Microscopy & Microanalysis conference 2012 in Phoenix, Arizona, Carl Zeiss Microscopy introduced an extension of its Field Emission Scanning Electron Microscope (FE-SEM) platform MERLIN. Customers can now choose between the systems MERLIN Compact, MERLIN VP Compact and MERLIN and configure them individually.
Agar Scientific, a leading supplier of microscopy accessories and consumables, reports on the range of reference and calibration standards available for scanning electron microscopes manufactured by Micro-Analysis Consultants.
Three Ocean Optics instruments have completed their eight month journey to Mars to study soil composition as part of the ChemCam mission. NASA's Mars Science Lab rover, Curiosity, was launched last November carrying customized Ocean Optics HR2000 spectrometers.
French Nanobiotix S.A. announced today that it entered into a strategic partnership with PharmaEngine, Inc. for the rapid development of NBTXR3, the lead product from the NanoXray pipeline of Nanobiotix.
SouthWest NanoTechnologies, Inc. has entered into a distribution agreement with Itochu Plastics Inc., part of the Itochu group, to distribute throughout Asia commercially-produced, specialty multi-wall and single-wall carbon nanotubes and carbon nanotube (CNT) inks, pastes and dispersions.
By adding new patents to its original license to Natcore Technology Inc., the National Renewable Energy Laboratory (NREL) has expanded that license under which Natcore will develop and commercialize a line of black silicon products based on NREL patents.
By incorporating the latest advancements in Silicon Drift Detector technology, the Octane SDD family delivers high-quality EDS data at previously unachievable speeds. Until now, the potential speed advantages of SDD technology have been unrealized due to losses in data quality at high count rates.
TMC, a unit of AMETEK Ultra Precision Technologies and a world leader in high-performance vibration control, today introduced SEM-Closure, an acoustic enclosure designed specifically for scanning electron microscopes (SEMs), at Microscopy & Microanalysis 2012 in Phoenix.