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Graphene studies by different optical, AFM and spectroscopy techniques

Combination of Atomic Force Microscopy (AFM), Raman / Fluorescence / Rayleigh microscopy and Scanning Near-Field Optical Microscopy (SNOM) provides unique opportunities for Graphene investigation. Different AFM techniques allow one to study mechanical, electrical, magnetic and even elastic properties of Graphene flakes.

Jun 2nd, 2010

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