SPP Process Technology Systems (SPTS), a leading manufacturer of plasma etch, deposition, and thermal processing equipment for the micro-device and semiconductor industry today announced, that it had won a multi-system order for its Sigma PVD, Omega Etch and Delta CVD wafer processing systems from a leading outsourced semiconductor assembly and test (OSAT) provider in the Asia-Pacific region.
Oxford Nanopore Technologies Ltd., the UK-based developers of nanopore technology for the direct, electronic analysis of single molecules, today announced that it has raised $41 million in new funding via a private placement of ordinary shares in the Company.
To better meet customer needs for more robust seals, Simrit has developed an advanced surface treatment process to improve seal function and service life. Simrit's Reduced Friction by Nanotechnology (RFN) method is one of the newest tools available for enhancing seal performance.
NanoProfessor, a division of NanoInk, Inc., focused on nanotechnology education, is pleased to announce that it has joined the Ibero-American Science and Technology Education Consortium (ISTEC), Inc. to help promote collaboration in the areas of science, technology and education among academia, government, industry and society.
SEMATECH announced today that Advanced Semiconductor Engineering (ASE) Incorporated, Altera Corporation, Analog Devices Inc. (ADI), LSI Corporation, ON Semiconductor Corporation, and Qualcomm Incorporated have joined SEMATECH's 3D Enablement program based at the College of Nanoscale Science and Engineering (CNSE) of the University at Albany.
After a four-month search, Natcore Technology Inc. has decided to establish the Natcore Research and Development Center at Eastman Business Park in Rochester, NY. The Rochester location was selected over several other finalists throughout the country.
SanDisk Corporation, the global leader in flash memory cards, last week announced a 64-gigabit (Gb), 2-bits-per-cell (X2) based monolithic chip made on 19-nanometer (nm) technology, the most advanced memory process technology node in the world.
Kadmon Pharmaceuticals LLC, and Nano Terra, Inc., today announced that they have entered into an agreement under which Kadmon has been granted a perpetual, worldwide exclusive license to three novel, clinical-stage product candidates owned by Nano Terra as well as rights to Nano Terra's drug discovery platform, Pharmacomer Technology.
Molecular Profiles, a leading pharmaceutical development service provider, today announced that it has been awarded a Queen's Award for Enterprise 2011 in the Innovation category for its nanoPASS (nanoscale Predictive Analytical Screening Solution) service platform.
Applied Nanotech's nanoparticle ink technology formulations of aluminum, copper, nickel and silver will be delivered using aerosolized jet, inkjet and spray coating methods and other non-contact printing techniques that will enable ultra-thin silicon wafers to be used for photovoltaic applications.
NanoBio Corporation today announced a licensing agreement with the University of Michigan that provides NanoBio with rights to an antigen that has been shown to prevent urinary tract infections (UTIs) following intranasal vaccination.
An agreement of cooperation with investment company Nanostart AG, winner of the open competitive tender* to manage venture capital fund Kama Fund First, was signed today by RUSNANO CEO and Chairman of the Executive Board Anatoly Chubais, Perm Krai Governor Oleg Chirkunov, and Nanostart CEO Marco Beckmann.
Kilopass Technology, Inc., a leading provider of semiconductor logic non-volatile memory intellectual property, today unveiled Itera, the industry's first and only embedded multi-time programmable NVM in 40nm, during the Linley Tech Mobile Conference.
Oxford Instruments Magnetic Resonance, the supplier of intelligent NMR, announces that it will launch the new GeoSpec2 modular core analysis instrument at the 2011 SPWLA Symposium, to be held May 14-19, 2011 in Colorado Spring, CO.
To achieve the perfect combination of optics and AFM at the molecular scale, distortions must be prevented. This will result in two images, such as optical and AFM images, that do not perfectly overlay. Reasons for distortions include aberrations arising from the lenses and mirrors of the optics system. To generate a seamless overlay of both techniques, JPK developed a cutting-edge calibration method, called DirectOverlay, which uses the accuracy of the AFM closed-loop scanning system to enable a true display of absolute angles and length coordinates.