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SanDisk Announces 19-Nanometer Manufacturing Technology

SanDisk Corporation, the global leader in flash memory cards, last week announced a 64-gigabit (Gb), 2-bits-per-cell (X2) based monolithic chip made on 19-nanometer (nm) technology, the most advanced memory process technology node in the world.

Posted: Apr 25th, 2011

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FEI Announces New Milestone for DualBeam

FEI, a leading instrumentation company that provides microscopy systems for research and industry, today announces that it has shipped the 250th Helios NanoLab DualBeam system.

Posted: Apr 21st, 2011

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Applied Nanotech Launches New Solar Inks Pilot Manufacturing Line

Applied Nanotech's nanoparticle ink technology formulations of aluminum, copper, nickel and silver will be delivered using aerosolized jet, inkjet and spray coating methods and other non-contact printing techniques that will enable ultra-thin silicon wafers to be used for photovoltaic applications.

Posted: Apr 20th, 2011

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Oxford Instruments Launches GeoSpec2 at SPWLA

Oxford Instruments Magnetic Resonance, the supplier of intelligent NMR, announces that it will launch the new GeoSpec2 modular core analysis instrument at the 2011 SPWLA Symposium, to be held May 14-19, 2011 in Colorado Spring, CO.

Posted: Apr 19th, 2011

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DirectOverlay Display and Analysis Software From JPK Instruments

To achieve the perfect combination of optics and AFM at the molecular scale, distortions must be prevented. This will result in two images, such as optical and AFM images, that do not perfectly overlay. Reasons for distortions include aberrations arising from the lenses and mirrors of the optics system. To generate a seamless overlay of both techniques, JPK developed a cutting-edge calibration method, called DirectOverlay, which uses the accuracy of the AFM closed-loop scanning system to enable a true display of absolute angles and length coordinates.

Posted: Apr 19th, 2011

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SRU Biosystems, Inc. Announces Recipient of Second Annual Label-free Technology Research Grant

The Company awarded its newly launched BIND SCANNER to the laboratory of John Lambris and Daniel Ricklin at the Department of Pathology and Laboratory Medicine at the University of Pennsylvania. The award was chosen on scientific merit including the level of innovation and the degree to which label-free biosensors could significantly advance breakthrough research in basic and applied science as well as in drug discovery.

Posted: Apr 19th, 2011

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Applied Seals North America Opens Design Center in Silicon Valley

Applied Seals North America, Inc. has opened a new applications and design center at its headquarters in Silicon Valley, increasing the company's capabilities in troubleshooting customers' problems with o-rings and other seals, prescribing the best application-specific solutions and designing leading-edge seals for the 22 nm technology node of semiconductor manufacturing.

Posted: Apr 19th, 2011

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NT-MDT Co. Opens a New R+D office in the USA

To address the increasing activity of NT-MDT Co. on the US and world markets of scanning probe microscopy equipment, the company has invited the experienced AFM developers and practitioners: Sergei Magonov, John Alexander and Sergey Belikov to form the research unit NT-MDT Development in Tempe, Arizona.

Posted: Apr 19th, 2011

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