Open menu
Nanowerk

Nanotechnology Business News

The latest product and company news

RSS Subscribe to our Nanotechnology Business News feed

SPP Process Technology Systems Extends Strong Order Momentum with Multi-System Order from Packaging Specialist

SPP Process Technology Systems (SPTS), a leading manufacturer of plasma etch, deposition, and thermal processing equipment for the micro-device and semiconductor industry today announced, that it had won a multi-system order for its Sigma PVD, Omega Etch and Delta CVD wafer processing systems from a leading outsourced semiconductor assembly and test (OSAT) provider in the Asia-Pacific region.

Posted: Apr 26th, 2011

Read more

Oxford Nanopore Technologies Announces $41 Million Fundraising

Oxford Nanopore Technologies Ltd., the UK-based developers of nanopore technology for the direct, electronic analysis of single molecules, today announced that it has raised $41 million in new funding via a private placement of ordinary shares in the Company.

Posted: Apr 26th, 2011

Read more

SanDisk Announces 19-Nanometer Manufacturing Technology

SanDisk Corporation, the global leader in flash memory cards, last week announced a 64-gigabit (Gb), 2-bits-per-cell (X2) based monolithic chip made on 19-nanometer (nm) technology, the most advanced memory process technology node in the world.

Posted: Apr 25th, 2011

Read more

FEI Announces New Milestone for DualBeam

FEI, a leading instrumentation company that provides microscopy systems for research and industry, today announces that it has shipped the 250th Helios NanoLab DualBeam system.

Posted: Apr 21st, 2011

Read more

Applied Nanotech Launches New Solar Inks Pilot Manufacturing Line

Applied Nanotech's nanoparticle ink technology formulations of aluminum, copper, nickel and silver will be delivered using aerosolized jet, inkjet and spray coating methods and other non-contact printing techniques that will enable ultra-thin silicon wafers to be used for photovoltaic applications.

Posted: Apr 20th, 2011

Read more

Oxford Instruments Launches GeoSpec2 at SPWLA

Oxford Instruments Magnetic Resonance, the supplier of intelligent NMR, announces that it will launch the new GeoSpec2 modular core analysis instrument at the 2011 SPWLA Symposium, to be held May 14-19, 2011 in Colorado Spring, CO.

Posted: Apr 19th, 2011

Read more

DirectOverlay Display and Analysis Software From JPK Instruments

To achieve the perfect combination of optics and AFM at the molecular scale, distortions must be prevented. This will result in two images, such as optical and AFM images, that do not perfectly overlay. Reasons for distortions include aberrations arising from the lenses and mirrors of the optics system. To generate a seamless overlay of both techniques, JPK developed a cutting-edge calibration method, called DirectOverlay, which uses the accuracy of the AFM closed-loop scanning system to enable a true display of absolute angles and length coordinates.

Posted: Apr 19th, 2011

Read more