Secondary ion mass spectrometry(SIMS) is a versatile, highly-sensitive technique for surface analysis and surface depth profiling of diverse materials. Hiden Analytical expands their primary system options to offer the choice of three initial equipment levels to suit a broad spread of budget capacities.
SanDisk Corporation today announced it has begun customer sampling of flash memory products based on its industry-leading 1Ynm process technology, which represents its second generation 19 nanometer manufacturing technology.
JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the work of the Nano-Mechanics Laboratory at the Indian Institute of Science Education and Research (IISER) Pune, India.
Samsung successfully implemented the new process into the smart card test chip, which means that this process technology fulfills the stringent quality requirements of the security solution market and can be successfully deployed on a commercial scale.
Fledgling spin-out company Drop-Tech has turned to microfluidics specialist Dolomite for its product development and fabrication skills to help productize the advanced and innovative Robo-Drop technology into the Mitos Dropix, a droplet-on-demand sampler that is set to make it easy to produce extremely miniaturized droplet compartments with excellent control over their contents.
QD Vision, Inc., manufacturer of Color IQ optical components for LCD applications, today announced breakthrough results on next generation quantum dot light emitting devices (QLEDs), which are currently in advanced development stage.
SouthWest NanoTechnologies, Inc., a world leader in high quality, Single-Wall and Specialty Multi-Wall carbon nanotubes, will be exhibiting new formulations of carbon nanotube inks that can lower display manufacturing costs at the 2013 Society of Information Display Conference.
Anasys Instruments reports on the announcement from the University of Illinois which describes the effect of nanometer-scale heating on semiconductor plasmonic microparticles which reveal surface plasmon resonance.
NanoSight reports on how Nanoparticle Tracking Analysis, NTA, is being used at the University of Wyoming in the characterization of the physical and interfacial properties of manufactured nano materials.
Silex Microsystems, the world's largest pure-play MEMS foundry, today announced that it has joined an international European Union-funded program aimed at developing a new MEMS manufacturing platform based on advanced inkjet-based printing technologies.
The system seamlessly integrates the Agilent 6000ILM AFM (atomic force microscope) and a HORIBA XploRA INV (inverted Raman microscope). The combination enables researchers to go beyond the optical diffraction limit to achieve nanoscale resolution as they perform Raman spectroscopy.