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Bruker Nano Surfaces Divison is a leading provider of high-performance scientific instruments and solutions for molecular and materials research, as well as for industrial and applied analysis. We cover Atomic Force Microscopy (AFM), White Light Optical Profilers, Stylus Profilers, Tribology & Mechanical Testing Tools as well as Fluorescence Microscopy Products:

  • Bruker Atomic Force Microscopes (AFM) and other nano technologies incorporate the very latest advances in AFM techniques, including the revolutionary PeakForce Tapping to ideally suit a wide array of application areas, from biology to semiconductors, from data storage devices to polymers, and from integrated optics to measurement of forces between particles and surfaces.
  • Bruker 3D metrology and inspection systems include 3D Optical Microscopes and Stylus Profilers. These deliver high speed automated measurements of critical dimensions, roughness, flatness and form. Applications include QA/QC on medical devices, tribology, film thickness, trench depths and optics form and finish. Our new production software enables fully automated one button operation. Instruments range from cost effective benchtop R&D systems to standalone high throughput production tools.
  • Bruker Tribological Tools and Mechanical Testing tools incorporate innovative, leading-edge technologies — including proprietary multi-sensing technology with high-sample-rate data-acquisition hardware & software, highest-accuracy force sensors and amplifiers, high-frequency acoustic emission sensors and amplifiers, and more.
  • Bruker Fluorescence Microscopy Products provide leading optical instrument designs and rich software features to researchers in neurobiology and cell biology for conducting uncaging experiments, optogenetics, simultaneous electrophysiology studies, as well as photoactivation, photostimulation and photoablation experiments.

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    Bruker Nano Surfaces Showroom

    Articles/Press Releases   Downloads (Brochures)

    Bruker Introduces New Value Standard with Scalable Microscopefor Combined Optical Surface Metrology and Imaging

      Dimension Edge with ScanAsyst

    Bruker Expands PeakForce Tapping AccessibilityNew Dimension Edge AFM Available with ScanAsyst

      Dimension FastScan
      Dimension FastScan BioAFM
      AFM-Raman Solutions

    Bruker Introduces New LumiMap Electroluminescence Toolfor Optical and Electrical Characterization on Epi Wafers for HB-LEDs

      UMT Universal Mechanical Tester
      ContourGT-X 3D Optical Microscope
      ContourGT InMotion 3D Optical Microscope

    Bruker Announces Acquisition of Prairie TechnologiesAcquisition Strengthens Bruker Nano Surfaces Division’s Position in Life Science Markets


    Bruker Advances Universal Mechanical Tester (UMT) DesignNew UMT Increases Flexibility and Seamlessly Integrates Optical Profiling and Mechanical Testing

    Images   Products
    Bruker QUANTAX X-ray spectrometer for electron microscopy

    Dimension Edge™ leverages the many innovations of the Dimension Icon® System to provide levels of performance and functionality only available from Bruker. (click on image to enlarge)

      Dimension FastScan AFM
      Dimension FastScan Bio AFM
      MultiMode 8 AFM
      BioScope Catalyst™ BioAFM
      Dimension Icon AFM Raman
    Bruker XFlash 6 detector series for SEM and TEM

    The ContourGT-I 3D Optical Microscope combines over three decades of surface metrology innovation and experience from industry partnerships into a single bench top system to deliver production-ready automation, measurement angle flexibility, outstanding imaging, and proven gage-capable performance. (click on image to enlarge)

      PeakForce Tapping
      AFM Probes
      UMT Universal Mechanical Tester
      ContourGT 3D Optical Microscopes
      Fluorescence Optical Microscopes
    The e-Flash high resolution EBSD detector

    Bruker's mechanical testing solutions provide the most comprehensive and versatile means of investigating tribology — friction, wear, and lubrication. (click on image to enlarge)


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