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Nanosurf AG

Founded in 1997, Nanosurf is a Swiss-based high-tech company providing scanning probe microscopes to customers around the globe. Our product range starts with very compact instruments, followed by state-of-the-art research systems, all the way up to fully customized and comprehensive solutions. Our customers in research, industry and teaching value the innovative approach, the modularity, and the ease of use of our products.

Products listed on Nanowerk

CoreAFM - The best value research AFM

The CoreAFM is an allround research-grade AFM with a high level of integration and compact system design. It is seamlessly extenda...

Flex-ANA — AFM for force mapping

A new tool for fully automated nanomechanical data acquisition and analysis. Key features and benefits: Fully integrated, ...

Flex-Axiom — AFM for materials research

Versatility, performance and seamless application extensions Key features and benefits: Easy to use and high performance ...

Flex-Bio — AFM for life science

Versatility and performance on inverted optical microscopes Key features and benefits: Seamless integration with inverted ...

Flex-FPM — Nano and cell manipulation

Flex-FPM (FluidFM® probe microscope) combines the force sensitivity and positional accuracy of the Nanosurf FlexAFM with FluidFM�...

LensAFM — AFM for optical microscopes

Extends the resolution of your upright microscope or 3D profilometer Key features and benefits: Mounts on virtually every ...

NaioAFM — AFM for small samples

All-in-one atomic force microscope for small samples and nanoeducation Key features and benefits: Ready-to-use, table-top ...

NaioSTM — STM for nanoeducation

All-in-one scanning tunneling microscope for an easy entry into the world of atoms Key features and benefits: Atomic resol...

NaniteAFM — AFM for large samples

Compact and mountable atomic force microscope for large-sample measurements Key features and benefits: Compact and robust ...

Other Products

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Downloads (Brochure/Application Notes/Articles)

Analyzing large surfaces using AFM stitching

This application note describes the automated stitching feature of the Nanosurf Nanite AFM scripting interface in combination with the Nanosurf Report...

 
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Analyzing large surfaces using AFM stitching Details

  • This application note describes the automated stitching feature of the Nanosurf Nanite AFM scripting interface in combination with the Nanosurf Report Expert analysis software.

Bulk copper deposition on gold studied in an EC-AFM application using the FlexAFM

This report effectively demonstrates the ability of the FlexAFM to monitor morphological changes during electrodeposition of material on an electrode ...

 
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Bulk copper deposition on gold studied in an EC-AFM application using the FlexAFM Details

  • This report effectively demonstrates the ability of the FlexAFM to monitor morphological changes during electrodeposition of material on an electrode surface.

Conductive AFM (C-AFM) measurements on a polished IC surface with multiple transistor contacts

Chemical-mechanical polishing (CMP) is a standard manufacturing process employed in the semiconductor industry during the fabrication of integrated c...

 
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Conductive AFM (C-AFM) measurements on a polished IC surface with multiple transistor contacts Details

  • Chemical-mechanical polishing (CMP) is a standard manufacturing process employed in the semiconductor industry during the fabrication of integrated circuits and memory disks. The topography and electrical properties of polished surfaces can easily be characterized via AFM.

Imaging DNA with the AFM (Application Note)

Atomic force microscopy imaging of DNA...

 
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Imaging DNA with the AFM (Application Note) Details

  • Atomic force microscopy imaging of DNA

Lateral force contrast on dots produced by Dip-Pen Nanolithography

The Nanosurf FlexAFM offers LFM in combination with easy handling, making it an obvious choice for DPN® analysis....

 
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Lateral force contrast on dots produced by Dip-Pen Nanolithography Details

  • The Nanosurf FlexAFM offers LFM in combination with easy handling, making it an obvious choice for DPN® analysis.

Scanning Thermal Microscopy (SThM) (Application Note)

This is an example of a scanning thermal measurement performed with a FlexAFM scan head equipped with a VertiSense temperature sensing cantilever from...

 
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Scanning Thermal Microscopy (SThM) (Application Note) Details

  • This is an example of a scanning thermal measurement performed with a FlexAFM scan head equipped with a VertiSense temperature sensing cantilever from AppNano.

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