Nanosurf Showroom |
| Latest News |
| (August 2011) Nanosurf to strengthen its position in China – Nanosurf and Suzhou Haizisi (Hzs) Nano Technology Co. Ltd. today announced the founding of a Sino-foreign Joint Venture, Hzs-Nanosurf, which after a preparation period of several months received its Chinese business license in the first half of August, 2011. The new Joint Venture represents a major milestone in the development of Nanosurf, which expects China to become one of the biggest markets for its products in the near future. More... |
| (June 2011) Nanosurf on the move! – Almost on the very day of the company's 14th anniversary, Nanosurf moved its headquarters to a new office location in the town of Liestal, Switzerland. Since May 30, 2011, Nanosurf AG has been operating from within its new premises, which offer an inspiring modern office environment with lots of room to serve visiting customers and to effectively perform advanced system demos. The flexible new workspace fits nicely with Nanosurf's strategy of continuous expansion, which has brought a consistent growth to the company over the years. More... |
| (May 2011) Nanosurf easyScan 2 and Nanite control software V3.0 released – Nanosurf released version 3.0 of its SPM control software for its easyScan 2 and Nanite scanning probe microscopes. This new version represents a major software overhaul, with a completely new user interface and improved ergonomics and features. Free upgrades are available to all registered customers. Please visit our Support pages for direct download or registration. |
| (March 2011) Leaders join forces in Atomic Force Microscopy – Nanosurf and Zurich Instruments today announced a strategic technology partnership. The two companies have agreed to cooperate in the development of high-frequency, high-performance scanning probe microscopy solutions. More... |
| (February 2011) Nanosurf easyScan 2, Mobile S and Nanite control software V2.2.4 released – Free upgrades are available to all registered customers. Visit our Support pages for download or registration. |
| (January 2011) New application note on EC-AFM available online – The appnote demonstrates the ability of the FlexAFM to monitor morphological changes during electro-deposition of material on an electrode surface. Here, copper was deposited on a gold surface. The deposition process was shown to be fully reversible. The experiment serves as proof of concept to study metal deposition, corrosion or other electrochemical phenomena at the nanoscale with EC-AFM. |
| Articles |
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Downloads |
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Imaging DNA with the AFM (652 KB) |
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easyScan 2 FlexAFM Brochure (6.5 MB) |
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Bulk copper deposition on gold studied in an EC-AFM application using the FlexAFM (1 MB) |
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easyScan 2 AFM & STM Brochure (3 MB) |
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Nanosurf Lithography Option (612 KB) |
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Nanite Brochure (0.8 MB) |
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AFM Stitching (1.4 MB) |
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easyPLL plus Brochure (0.8 MB) |
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Scanning Thermal Microscopy (2.5 MB) |
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Company Brochure (1.1 MB) |
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Lateral Force Contrast on Dots produced by Dip-Pen Nanolithography (604 KB) |
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FluidFM (1.3 MB) |
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How quality control of everyday products with AFM creates competitive advantages |
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LensAFM (1.2 MB) |
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Super-flat AFM for SEM (0.8 MB) |
| Videos/Images/Podcasts |
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Products |
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Lithography by Local Oxidation of Titanium |
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Nanosurf FluidFM (available 2012) – Unique New Tool for Single Cell and Small Object Micro-Manipulation, Imaging and Beyond |
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Nanosurf LensAFM – Enhance Your Optical Microscope or Profilometer |
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Molecular structure of a self-assembled monolayer |
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Nanosurf FlexAFM – Flexible Research AFM System for Materials and Life Science |
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Nanosurf easyScan 2 – Modular SPM System for Education and Science |
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Butterfly wings - a fragile biological nanostructure |
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Nanosurf NaniteAFM – Mountable AFM for Industrial Applications |
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Nanosurf AFM for SEM – A Unique Option for Your Scanning Electron Microscope |
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Human hair treatement |
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Nanosurf easyPLL plus – Your affordable PLL solution for non-contact AFM |
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Accessories – Everything to Complement Your Nanosurf SPM System |
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Pentacene Film on TiO2 |
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Screw dislocations in GaN |
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Kelvin Probe Force Microscopy (KPFM) using the Nanosurf FlexAFM |
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Analysis of ePTFE membrane using the Nanosurf easyScan 2 AFM |
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NASA's Phoenix Mars Lander's AFM |
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Nanosurf atomic force microscopes and surface analysis |
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