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Posted: June 29, 2010
International Workshop for Scanning Probe Microscopy for Energy Applications - call for abstracts
(Nanowerk News) Abstracts for contributed talks and posters are now being accepted for the International Workshop for Scanning Probe Microscopy (SPM) for Energy Applications.
Co-organized by Oak Ridge National Laboratory (ORNL) and Asylum Research, the workshop will held at ORNL September 15-17, 2010. Deadline for abstract submission is August 13.
The program will include invited and contributed talks covering recent advances in
characterization of energy-relevant materials systems using SPM/AFM techniques, as well as the state of the art in energy
dissipation and transformation measurements by SPM/AFM. The three-day meeting will also include a poster session, as
well as an equipment lab and hands-on tutorials for demonstration of recently developed dynamic and multi-spectral
SPM/AFM modes on Asylum's Cypher™ and MFP-3D™ SPM/AFMs. The keynote talk will be on "Local Probing of
Carrier Dynamics in Polymer Photovoltaic Materials" by David Ginger of the University of Washington.
Detailed information on abstract submission, agenda, etc. can be found at www.asylumresearch.com/Energy.
Abstracts can be submitted on the following topics (but are not limited to):
Mapping of carrier dynamics and photoinduced behavior of photovoltaic materials
Micro Raman and NSOM imaging of energy-related materials
Local ionic and electronic transport in fuel cells and Li-ion batteries
Energy harvesting by nanostructured piezoelectric and ferroelectric systems
Novel advances in functional probes – microwave, thermal, and conductive
Imaging energy dissipation by multimodal and Band Excitation SPM/AFM
Bias-induced phase transitions
About the Center for Nanophase Materials Sciences at Oak Ridge National Laboratory
The Center for Nanophase Materials Sciences at Oak Ridge National Laboratory is one of the five DOE Nanoscale
Science Research Centers (NSRCs), premier national user facilities for interdisciplinary research at the nanoscale,
supported by the DOE Office of Science. Together the NSRCs comprise a suite of complementary facilities that provide
researchers with state-of-the-art capabilities to fabricate, process, characterize and model nanoscale materials, and
constitute the largest infrastructure investment of the National Nanotechnology Initiative. The NSRCs are located at
DOE's Argonne, Brookhaven, Lawrence Berkeley, Oak Ridge, Sandia and Los Alamos National Laboratories.
About Asylum Research
Asylum Research is the technology leader in atomic force and scanning probe microscopy (AFM/SPM) for both materials
and bioscience applications. Founded in 1999, we are an employee owned company dedicated to innovative
instrumentation for nanoscience and nanotechnology, with over 250 years combined AFM/SPM experience among our
staff. Our instruments are used for a variety of nanoscience applications in material science, physics, polymers,
chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding
and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces,
adhesion, and more. Asylum's product line offers imaging and measurement capabilities for a wide range of samples,
including advanced techniques such as electrical characterization (CAFM, KFM, EFM), high voltage piezoresponse force
microscopy (PFM), thermal analysis, quantitative nanoindenting, and a wide range of environmental accessories and
Asylum's MFP-3D set the standard for AFM technology, with unprecedented precision and flexibility. The MFP-3D is
the first AFM with true independent piezo positioning in all three axes, combined with low noise closed-loop feedback
sensor technology. The MFP-3D offers both top and bottom sample viewing and easy integration with most
commercially-available inverted optical microscopes.
Asylum's new Cypher AFM is the world's first new small sample AFM/SPM in over a decade, and sets the new standard
as the world's highest resolution AFM. Cypher provides low-drift closed loop atomic resolution for the most accurate
images and measurements possible today, rapid AC imaging with small cantilevers, Spot-On™ automated laser alignment
for easy setup, integrated thermal, acoustic and vibration control, and broad support for all major AFM/SPM scanning
modes and capabilities.
Asylum Research offers the lowest cost of ownership of any AFM company. Ask us about our industry-best 2-year
warranty, our legendary product and applications support, and our exclusive 6-month money-back satisfaction guarantee.
We are dedicated to providing the most technically advanced AFMs for researchers who want to take their experiments to
the next level. Asylum Research also distributes third party cantilevers from Olympus, Nanoworld/Nanosensors, and our
own MFM and iDrive™ tips.
For additional information, contact Terry Mehr, Director of Marketing Communications, or Monteith Heaton, EVP,
Marketing/Business Development, Asylum Research, 6310 Hollister Avenue, Santa Barbara, CA 93117, 805-696-
6466x224/227, Terry@AsylumResearch.com, Monte@AsylumResearch.com.