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Posted: Jun 07, 2011

Leti to present challenges and opportunities for companies and researchers in key new technologies

(Nanowerk News) Emerging technologies enabled and supported by breakthroughs in microelectronics have opened exciting new markets and research fields for innovative companies and leading researchers.
On June 27-28, CEA-Leti's 13th Annual Review will present the latest results in micro- and nanotechnologies that address the challenges and opportunities in these areas, along with Leti's systems of transferring innovation to industry.
The annual review includes more than 30 presentation topics, including:
European electronics and innovation
  • Enabling Technologies & Industrial Roads, Jean-Marc Chery, STMicroelectronics
  • Micro Nanotechnologies Landscape, Prof. Alberto Sangiovanni-Vicentelli, UC Berkeley
  • Imaging the future
  • More than Imaging: JoŽl Karecki, Philips
  • Enter the Future of Imaging, Dr. Valťrie Nguyen, Leti
  • Electronics and sensors for biomedical
  • Bioproduction by Design, Dr. Christian Valentin, Sanofi-Pasteur
  • Motion Sensors and Applications: Sam Guilaumť, Movea CEO
  • Silicon technologies
  • Future Nanoelectronics Device Research Challenges and Opportunities, Prof. Yohio Nishi, Stanford University
  • MEMS & NEMS and Applications, Philippe Andreucci, Leti
  • Sustainable immersive communication technologies
  • Holistic Approach of Green Communications, Adel Rouz, Fujitsu
  • Future compact antennas, Dr. Laurent Dussopt, Leti
  • Leti leverage for industry
  • Leti Leverage, an Innovative Path for Industry, Dr. Marie-NoŽlle Semeria, Leti
  • III-V and silicon for a brighter future, Xavier Hugon, Leti
  • Other speakers include Prof. Pasquale Pistorio, honorary chairman of STMicroelectronics, and Laurent Malier, CEO of Leti. The two-day event includes a gala dinner on June 27 and networking opportunities where business executives and top researchers can explore new ideas and strategic thinking in the areas of micro- and nanotechnology.
    Visit for registration information.
    Source: CEA-Leti
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