Surface metrology and characterization is critical for product performance across a wide range of applications and industries including semi-conductor, LED, data storage, medical and automotive, to name a few. 3D optical microscopes are among the fastest and most accurate imaging systems available for rapid and precise metrology in research and development as well as production monitoring and process control. At times, inspection of extremely thin films or high lateral resolution requirements are encountered in addition to more traditional measurements for the 3D microscope which present challenges beyond the capability of 3D optical microscope inspection.
In this webinar, Bruker will cover the complimentary use of their integrated NanoLens AFM module to serve these additional challenging metrology applications.
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