NANOSENSORS AdvancedTEC probes have a tetrahedral AFM tip that protrudes over the very end of the cantilever.
This unique feature allows precise positioning and offers real tip visibility from top even when the AFM probe is tilted when it is mounted onto the AFM head.

AdvancedTEC (ATEC) AFM probes are therefore ideal for all applications where the AFM tip has to be placed exactly on the point of interest, the AFM tip should be illuminated, two or more AFM tips should be put into contact, as basis for TERS probes or other applications where the AFM tip has to be visible (eg. nano manipulation).
The AFM probes of the AdvancedTEC AFM probe series are available for contact mode, non-contact/dynamic/tapping mode and force modulation mode imaging.
They are either available in their bare silicon version or as conductive versions either fully coated with gold or platinumiridium.

ATEC-CONT ( AdvancedTEC AFM probe for contact-mode):
Typical force constant: 0.2 N/m
Typical resonance frequency: 15 kHz

ATEC-CONTAu ( gold coated )
Typical force constant: 0.2 N/m
Typical resonance frequency: 15 kHz

ATEC-CONTPt ( PlatinumIridium coated)
Typical force constant: 0.2 N/m
Typical resonance frequency: 15 kHz

ATEC-NC (AdvancedTEC AFM probe for non-contact/dynamic/tapping mode):
Typical force constant: 45 N/m
Typical resonance frequency: 335 kHz

ATEC-NCAu (gold coated):
Typical force constant: 45 N/m
Typical resonance frequency: 335 kHz

ATEC-NCPt ( PlatinumIridium coated ):
Typical force constant: 45 N/m
Typical resonance frequency: 335 kHz

ATEC-FM ( AdvancedTEC for Force Modulation Mode):
Typical force constant: 2.8 N/m
Typical resonance frequency: 85 kHz

ATEC-FMAu ( gold coated ):
Typical force constant: 2.8 N/m
Typical resonance frequency: 85 kHz

ATEC-FMPt ( PlatinumIridium coated )
Typical force constant: 2.8 N/m
Typical resonance frequency: 85 kHz

Please contact us if you would like to know more or have a look at: https://www.nanosensors.com/afm-tips-overview