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  • Diamond Coated AFM Tips
  • Diamond Coated AFM Tips

Diamond Coated AFM Tips

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  • Diamond Coated AFM Tips
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  • NANOSENSORS
  • Support NANOSENSORS
  • Rue des Saars 10
  • Neuchâtel
  • Neuchâtel
  • Switzerland
  • +41 32 5 521 521
  • https://www.nanosensors.com/afm-tips-catalog
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  • NANOSENSORS™ offers two types of diamond coated AFM tips:

    - Diamond Coated AFM tips (DT) are mainly used for applications where a high wear resistance of the AFM tip is necessary e.g., friction measurements, wear measurements, and the measurement of elastic properties on hard materials

    - Conductive Diamond Coated AFM tips (CDT) are mainly used in applications where not only wear-resistance but also a certain conductivity of the AFM probe is required e.g.
    Tunneling AFM , Conducting AFM, Scanning Capacitance Microscopy (SCM) and others

    Both types of diamond coated AFM tip are produced by coating AFM probes of the PointProbe® Plus type with a real polycrystalline diamond coating on the tip-side of the AFM cantilever. The diamond coating has to be relatively thick in order to form a closed layer over the whole AFM probe. The typical macroscopic AFM tip radius of curvature of these AFM probes is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.

    The following AFM probe types are available:


    CDT-CONTR – contact mode type AFM cantilever, electrically conductive highly doped diamond coating on the AFM tip side, aluminum reflex coating on the backside of the AFM cantilever
    Typical force constant: 0.5 N/m
    Typical resonance frequency: 20 kHz

    DT-CONTR - contact mode type AFM cantilever, wear resistant diamond coating on the AFM tip side, aluminum reflex coating on the backside of the AFM cantilever
    Typical force constant: 0.5 N/m
    Typical resonance frequency: 20 kHz



    CDT-NCHR – tapping mode/dynamic mode type AFM cantilever, electrically conductive highly doped diamond coating on the AFM tip side, aluminum reflex coating on the backside of the AFM cantilever:
    Typical force constant: 80 N/m
    Typical resonance frequency: 400 kHz

    DT-NCHR - tapping mode/dynamic mode type AFM cantilever, wear resistant diamond coating on the AFM tip side, aluminum reflex coating on the backside of the AFM cantilever
    Typical force constant: 80 N/m
    Typical resonance frequency: 400 kHz



    CDT-NCLR electrically conductive highly doped diamond coating on the AFM tip side, aluminum reflex coating on the backside of the AFM cantilever:
    Typical force constant: 72 N/m
    Typical resonance frequency: 210 kHz

    DT-NCLR - wear resistant diamond coating on the AFM tip side, aluminum reflex coating on the backside of the AFM cantilever:
    Typical force constant: 72 N/m
    Typical resonance frequency: 210 kHz



    CDT-FMR – force modulation type AFM cantilever, force constant between contact and non-contact mode values makes it possible to use this AFM cantilever for contact mode measurements with medium forces as well as for non-contact or tapping mode measurements, electrically conductive highly doped diamond coating on the AFM tip side, aluminum reflex coating on the backside of the AFM cantilever:
    Typical force constant: 6.2 N/m
    Typical resonance frequency: 105 kHz

    DT-FMR - force modulation type AFM cantilever, force constant between contact and non-contact mode values makes it possible to use this AFM cantilever for contact mode measurements with medium forces as well as for non-contact or tapping mode measurements, wear resistant diamond coating on the AFM tip side, aluminum reflex coating on the backside of the AFM cantilever:
    Typical force constant: 6.2 N/m
    Typical resonance frequency: 105 kHz

    Please contact us for further information or have a look at the brochure on Diamond Coated PointProbe® Plus AFM probes: www.nanosensors.com/Diamond_Coated_PointProbe_Plus.pdf

    Application examples can be found in the NANOSENSORS blog: https://www.nanosensors.com/blog/tag/conductive-diamond-coated-afm-probes/

  • Research Driven Excellence since 1990

    Since 1990 researchers world-wide rely on the guaranteed high quality of NANOSENSORS™ probes for Atomic Force Microscopy and Scanning Probe Microscopy. NANOSENSORS™ SPM tips are used in university research and commercial R&D labs where high resolution, consistent quality and reproducibility of results are essential.

    Our cutting-edge products include high-resolution AFM tips with a typical radius of 2 nm, highly wear resistant conductive AFM probes, AFM probes with very small variation in force constant and resonance frequency and very low thermal drift which are especially popular for biological applications and many more.

    Since 1990 we provide the most consistent AFM probes quality, year by year, batch by batch, wafer by wafer, AFM tip by AFM tip.

    On our NANOSENSORS blog we regularly showcase scientific articles published by the many users of our AFM probes.



    NANOSENSORS™ is a trademark of NanoWorld AG


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