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Micro-CT for SEM


Request the latest price from Bruker Nano GmbH

  • Stefan Meier,Bruker Nano GmbH
  • Micro-CT for SEM

Contact Details

  • Bruker Nano GmbH
  • Stefan Meier
  • Am Studio 2D
  • Berlin
  • N/A
  • Germany
  • +49 30 670990-8591

Contact Supplier

  • Stefan Meier,Bruker Nano GmbH

  • True 3D Microscopy for SEM

    Micro computed tomography (Micro-CT) for SEM adds true 3D microscopy to your SEM, regardless of manufacturer and model. Micro-CT for SEM extends the surface information gained with conventional SEM imaging by allowing an unique insight into a specimen’s internal microstructure, nondestructively and with ease of use.

    Key features at a glance

    • Obtain information on a specimen’s internal microstructure nondestructively and without any additional sample preparation
    • Measure and visualize the internal morphology in 2D and 3D
    • Generate realistic models for a virtual travel through a specimen
    • Intuitive and easy-to-use software for 3D rendering, visualization as three orthogonal sections or as slice-by-slice movie
    • Scanning volume is up to 4 mm in diameter, maximum sample length is 10 mm
    • Details are detectable down to a size of 400 nm

    Get more information

  • Bruker Nano Analytics, headquartered in Berlin, Germany is a worldwide leading manufacturer of systems for compositional and structural analysis at the micro- and nano-scale for electron microscopes and using X-ray fluorescence spectrometers.

    As a research-focused company, we invest in the development of innovative products to satisfy the needs of our markets and to give our clients the opportunity to perform their work using the most modern equipment available. Our instruments are used in research, education and a wide range of industries, including chemistry, pharmaceuticals, semiconductor, life science, nanotechnology. Our spectrometry product lines comprise:
    • QUANTAX spectrometers for microanalysis on scanning and transmission electron microscopes (EDS and WDS),
    • The XTrace micro-spot X-ray source for attachment to scanning electron microscopes,
    • The S2 PICOFOX spectrometer for total reflection X-ray fluorescence elemental analysis(TXRF),
    • The M4 TORNADO µ-XRF spectrometer for fast elemental distribution analysis.

    The products for structural analysis consist of:
    • QUANTAX EBSD, the fast and easy-to-use electron backscatter diffraction system (EBSD) for SEM
    • Micro-CT for SEM, the computed X-ray microtomography attachment for SEM.
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