Lightning - In Situ TEM Heating & Biasing
- Price:
- Request a Quote
- Vendor:
- DENSsolutions
- Country:
- Netherlands | Contact Details
-
The Lightning In Situ TEM Biasing & Heating Series from DENSsolutions offers customers the power to acquire real-time data about specimen dynamics activated by electric fields and/or temperature. Users can analyze the next-generation of nano-electronic materials and devices using the Lightning Series.
Lightning Application Fields:
-ReRam
-Solar cells
-Piezoelectronics
Sample Preparation with Conventional Techniques'
The sample preparation methods used for preparing conventional TEM samples such as nanowires, lamellas, and particles are ideal for the Nano-Chip. FIB lamellas are the most frequently used samples for biasing experiments. DENSsolutions has collaborated with a few academic partners to create a distinctive FIB workflow using a tailored FIB stub exclusively designed for the Nano-Chip.
This process considerably decreases the total workflow time and delivers a better success rate. Additional techniques like micro-manipulators are ideal for sample preparation onto the Nano-Chip.
Compatibility:
- JEOL
- FEI/Thermo Fisher Scientific -
DENSsolutions is your dedicated partner for In Situ EM research. Our in situ solutions for heating, biasing, gas and liquid allow you to control these stimuli inside your Electron Microscope during real-time observation. With our dedicated technology, software and service, we support you from sample management to data analysis. DENSsolutions upgrades the Electron Microscope into a laboratory for nanotechnology that unveils the evolutionary dynamics of your sample at the atomic scale.
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