Scanning probe microscopy Conferences and Events

Scanning probe microscopy is a family of techniques that image and measure surfaces by scanning a sharp probe across a sample and detecting local interactions between the tip and the material. In nanotechnology, scanning probe microscopy is important because it can provide nanoscale or atomic-scale information about topography, forces, conductivity, magnetism, friction, charge, and molecular organization. Key methods include atomic force microscopy, scanning tunneling microscopy, Kelvin probe force microscopy, and magnetic force microscopy.

Scanning probe microscopy matters because it can characterize surfaces, interfaces, nanostructures, and soft materials under conditions that complement electron microscopy and optical methods. It is used for nanocharacterization, nanomechanics, biomaterials, polymers, 2D materials, semiconductor devices, molecular electronics, and surface chemistry. Some scanning probe methods can also manipulate atoms, write patterns, or measure local electrical and mechanical behavior, linking characterization with nanofabrication.

Conferences on scanning probe microscopy appear in microscopy, surface science, nanotechnology, materials science, biophysics, and semiconductor programs. Sessions often cover atomic force microscopy, nanoscale electrical mapping, tip-enhanced spectroscopy, high-speed imaging, and quantitative force measurements. Tracking these events helps researchers follow tools that probe nanoscale surfaces one interaction at a time.

To learn more, read our detailed glossary article on scanning probe microscopy.