The power of Raman spectroscopy is well known in structural/chemical analysis in the micrometer scale. However, Tip Enhanced Raman Spectroscopy (TERS) is an emerging tool, extending the capability down to the few tens of nanometer scale. Tip Enhanced Fluorescence Spectroscopy (TEFS) is equally important for imaging at the nanoscale. Both scientists and instrument manufacturers are working towards making the instrument easy-to-use in the laboratory, unveiling the scientific principles and pushing the boundary of frontier research on understanding nanoscale structure and properties. TERS and TEFS are step-change technologies, which can change the course of characterization at the nanoscale. The National Physical Laboratory (UK) is organizing a two-day conference on Tip Enhanced Raman and Fluorescence Spectroscopy (TERFS) to bring together leading scientists and instrument manufacturers from all over the world to discuss scientific and technological progress, challenges and opportunities in the field.
Researchers in nanoscale chemical analysis under atmospheric conditions
Scientific presentations by world leading scientists / technologists
Networking with key researchers
Discover out how TERS and TEFS will impact measurement and characterization
Opportunities for collaborations in grant funded research
Abstracts are invited for oral and poster presentations. The abstract should be less than 300 words and two figures. Abstracts need to be sent to Debdulal Roy. Abstract Submission Deadline: 10 December 2007.
There is also an opportunity for tabletop instrument demonstrations.