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KLA-Tencor Upgrades 28xx Defect Inspection System

KLA-Tencor Corporation, a leading supplier of process control and yield management solutions for the semiconductor and related industries, announced XP, a new upgrade package for 28XX broadband brightfield inspection systems.

Posted: Jul 1st, 2009

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ItN Nanovation erhält Grossauftrag für kommunale Kläranlage

Die Nanostart-Beteiligung ItN Nanovation AG wird im Rahmen eines Großprojektes erstmals in Deutschland eine kommunale Kläranlage mit CFM-Systems Modulen bestücken. Damit gelingt es dem Unternehmen, ein wichtiges, großvolumiges Referenzprojekt zu realisieren, mit dem die technologische und ökonomische Überlegenheit keramischer Flachfiltermembrane bei der Wasserfiltration erneut gezeigt werden kann.

Posted: Jul 1st, 2009

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Nova Receives Multiple Metrology Orders for 45 nm Copper

Nova Measuring Instruments Ltd., provider of leading edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, received a multiple tool order for its integrated NovaScan metrology solution for measurement of Copper line thickness by a leading foundry.

Posted: Jun 30th, 2009

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Carl Zeiss Will Launch a New Product Line for High Resolution Microscopy

Carl Zeiss will launch a new product line for high resolution microscopy this year. Thanks to the combination of two techniques in ZEISS microscopes - HR-SIM (High Resolution Structured Illumination Microscopy) and PAL-M (Photoactivated Localization Microscopy) - biomedical scientists are able to examine objects at maximum resolution.

Posted: Jun 29th, 2009

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Europe Makes Strides on Sustainable Semiconductor Manufacturing

Pioneering the European electronics industry?s efforts for sustainable manufacturing of semiconductors, Linde Gases, a division of The Linde Group, has installed Europe's first CE-marked on-site electronics grade fluorine (F2) generator at STMicroelectronics' Crolles 300mm wafer fabrication plant in France.

Posted: Jun 29th, 2009

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