SEMATECH announced that Silvaco, Inc., a leading provider of Technology Computer Aided Design (TCAD) and Electronic Design Automation (EDA) software, has joined SEMATECH to collaboratively develop advanced modeling and simulation tools.
Market leaders in temperature controlled microscopy, Linkam Scientific Instruments report on the use of their functional LTS420 temperature stage for crystallization studies at the Technische Universitšt Kaiserslautern.
StoreDot Ltd., a nanotechnology startup company which has discovered the first bio-organic Nanodots, has announced that it has received $6 million from several strategic and private investors. StoreDot will use the funds to further advance its technology in mobile devices from the prototype stage to commercialization.
EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has announced a more than 25 percent increase in the performance of its Hikari XP and Digiview EBSD cameras while maintaining their industry-best indexing quality.
XEI Scientific Inc, maker of the popular Classic EVACTRON De-Contaminator Plasma Cleaning System for electron microscopes and other vacuum chambers, announces the release of Zephyr - turbo-pumped remote plasma cleaning for faster SEM contamination removal utilizing the flowing Afterglow process.
The new systems provide efficient and effective application-specific workflows for semiconductor manufacturing and scientific research. They include the new Metrios TEM for advanced semiconductor manufacturing metrology, Talos TEM that provides high-speed imaging and analysis for materials and life sciences applications, and the Titan Themis TEM for enhanced atomic-scale measurements of material properties.
Nanolab Technologies, Inc. has acquired FIB Lab, Inc., a well-established Silicon Valley analytical lab founded in 1992 that supplies Focused Ion Bean Circuit Edit services to the semiconductor industry.
The 20/30 PV microspectrophotometer allows you to image and measure spectra by absorbance, reflectance, fluorescence and emission from the deep ultraviolet to the near infrared of sub-micron sized sample features... automatically.