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FEI Introduces Three New TEM Systems

The new systems provide efficient and effective application-specific workflows for semiconductor manufacturing and scientific research. They include the new Metrios TEM for advanced semiconductor manufacturing metrology, Talos TEM that provides high-speed imaging and analysis for materials and life sciences applications, and the Titan Themis TEM for enhanced atomic-scale measurements of material properties.

Posted: Aug 2nd, 2013

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NanoMech Secures Three Ground-Breaking Patents

Today NanoMech, Inc. announced the issuance of three patents that will position the company's nGlide Division as a world leader in the lubricant's additives and fully formulated lubricants industry.

Posted: Aug 1st, 2013

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