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Nanoribbons for graphene transistors for tomorrow's nanoelectronics

Scientists report how they have managed for the first time to grow graphene ribbons that are just a few nanometres wide using a simple surface-based chemical method. Graphene ribbons are considered to be hot candidates for future electronics applications as their properties can be adjusted through width and edge shape.

Posted: Jul 21st, 2010

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Researchers simplify process to make nanowires

Researchers came up with a process simple enough to be achievable with a nine-volt battery. The researchers apply an electrical charge to the nanostructures during the manufacturing process, charging each tiny wire and making it repel its neighbor.

Posted: Jul 21st, 2010

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Carbon nanotubes as transistor material

ETH Zurich researchers have built a transistor whose crucial element is a carbon nano-tube, suspended between two contacts, with outstanding electronic properties. A novel fabrication approach allowed the scientists to construct a transistor with no gate hysteresis. This opens up new ways to manufacture nano-sensors and components that consume particularly little energy.

Posted: Jul 21st, 2010

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Nanoparticle-protein mix to greatly increase computer capacity

Scientists from the Hebrew University of Jerusalem have succeeded in showing how it is possible to greatly expand the memory capacity of future computers through the use of memory units based on silica nanoparticles combined with protein molecules obtained from the poplar tree.

Posted: Jul 21st, 2010

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Carl Zeiss nano image contest off to a successful start

More than 70 users of ZEISS electron and ion microscopes from all over the world have already submitted their nano masterpieces to the first ever Carl Zeiss Nano Image Contest. The current voting record of the overall competition is held by Peter Nirmalraj from Trinity College Dublin.

Posted: Jul 21st, 2010

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Researchers develop unique method to improve testing for small delay defects in semiconductors

Semiconductor Research Corporation (SRC), the world's leading university-research consortium for semiconductors and related technologies, the National Science Foundation (NSF) and researchers from the University of Connecticut (UConn) and Duke University have found a new way to significantly improve the screening of small delay defects (SDDs) commonly found in semiconductors.

Posted: Jul 20th, 2010

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