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New FluoView FV10i Confocal Laser Scanning Microscope from Olympus

The new Olympus FluoView FV10i confocal laser scanning microscope system brings a whole new level of accessibility to confocal microscopy. It is designed to remove all of the complex steps involved in setting-up and using confocal microscopes, ensuring that users can concentrate on the images and data without any prior expertise.

Posted: Nov 17th, 2009

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Picosun tops previous 12 month sales record in six months

Picosun Oy, Finland-based global manufacturer of state-of-the-art Atomic Layer Deposition (ALD) systems announced today that during the six months of May - October 2009 it managed to outdo its full 12 month sales record from previous May 2008 - April 2009 fiscal year .

Posted: Nov 17th, 2009

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New Digital Camera from Leica for Fluorescence Applications

The detection and documentation of low light fluorescence signals in live cell experiments is a particular challenge for digital cameras. To meet this demand, Leica Microsystems adds the new Leica DFC345 FX to its portfolio of powerful digital cameras.

Posted: Nov 16th, 2009

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SEMATECH Names Daniel Armbrust as President and CEO

SEMATECH, the global consortium of semiconductor manufacturers, today announced that it has named Daniel Armbrust to serve as its President and Chief Executive Officer. Armbrust will succeed Michael R. Polcari, who has been appointed SEMATECH's Chairman of the Board.

Posted: Nov 16th, 2009

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Nanolaminated Materials to be Developed for Nuclear Power Application

Seattle-based Modumetal announced that it has received a Small Business Innovative Research contract from the Department of Energy (DOE) to demonstrate application of its nanolaminate and functional gradation technology to structures that would improve the longevity and safety of Gen IV nuclear power plants.

Posted: Nov 14th, 2009

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Nanometrics Receives Multiple Metrology Orders for High-Brightness LEDs

Nanometrics Incorporated, a leading supplier of advanced process control metrology systems used primarily in the manufacturing and packaging of semiconductors, solar photovoltaics and high-brightness LEDs, today announced multiple orders from new and existing HB-LED customers for RPMBlue and IVS185 metrology systems, which will be used for photoluminescence mapping and critical dimension and overlay control, respectively.

Posted: Nov 13th, 2009

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