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Veeco Introduces New InSight 3D Atomic Force Microscope

Veeco Instruments Inc. announced the introduction of its new InSight 3D Automated Atomic Force Microscope Platform, the only metrology system available with the accuracy and precision required for non-destructive, high resolution three-dimensional measurements of critical 45nm and 32nm semiconductor features, with the speed to qualify as a true fab tool.

Posted: Dec 4th, 2007

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