Researchers develop a method for sensing the electric field generated in semiconductor devices during operation. The technique is demonstrated for a diamond device, with nitrogen-vacancy centers acting as local electric-field probes, subject to bias voltages up to 150 volt.
Scientists ran a series of hard particle simulations to study melting in two-dimensional systems. Specifically, the team explored how particle shape affects the physics of a 2-D solid-to-fluid melting transition.
Researchers have developed a new fluorescence microscopy method: STEDD (Stimulation Emission Double Depletion) nanoscopy produces images of highest resolution with suppressed background. The new method yields an enhanced image quality, which is advantageous when analyzing three-dimensional, densely arranged subcellular structures.