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Dedicated Probe for SIMS/SNMS

The Hiden EQS-series of quadrupole mass spectrometer probes were introduced for measurement of external ions in a vacuum environment, specifically for application to the SIMS surface analysis technique.

Posted: Sep 24th, 2013

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Applied Materials and Tokyo Electron to Merge

Applied Materials, Inc. and Tokyo Electron Limited today announced a definitive agreement to create a global innovator in semiconductor and display manufacturing technology via an all-stock combination which values the new combined company at approximately $29 billion.

Posted: Sep 24th, 2013

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Photoluminescence Evaluation of Colloidal CdTe Quantum Disks

Researchers at the Istituto Italiano di Tecnologia, Genova and IMEM-CNR, Parma in Italy have used the FLS920 photoluminescence spectrometer from Edinburgh Instruments to measure the photoluminescence spectral properties, quantum efficiencies and lifetimes of novel CdTe semiconductor quantum disks, synthesized from disk-shaped Cu2Te nanocrystals.

Posted: Sep 23rd, 2013

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Veeco to Purchase Synos Technology

Synos designs and manufactures Fast Array Scanning Atomic Layer Deposition (FAST-ALD) systems that are enabling the production of flexible organic light-emitting diode (OLED) displays for mobile devices.

Posted: Sep 20th, 2013

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'Bringing the Nanoworld Together', an Initiative From Oxford Instruments to Share Expertise With Nanotechnology Researchers in India

Following the great success of Oxford Instruments' seminar in Bangalore last December, the company has planned two more seminars to be held this year in India. BTNT 2013 will be held at Mohali in association with Indian Institute of Science Education and Research Mohali, Institute of Nano Science and Technology, and at Mumbai in association with Indian Institute of Technology Bombay. The seminars will focus on cutting edge nanotechnology tools and their use in multiple fields.

Posted: Sep 18th, 2013

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