Posted: January 30, 2010

Scientific symposium for nanomeasurement-driven research announced

(Nanowerk News) Agilent Technologies Inc. has announced that the first Nano Measure Scientific Symposium (Nano Measure 2010) will take place June 3-4 at Jagiellonian University in Krakow, Poland. The two-day event will feature some of the most prestigious scientists presenting leading-edge, nanomeasurement-driven research.
The Nano Measure 2010 agenda comprises four applications-focused sessions: In Situ Life Science Studies, Biomaterials & Single-Molecule Characterization at the Nanoscale; Polymers -- Nanomorphology, Controlled Fabrication & Property Characterization; Nanomechanical Properties of Organic & Inorganic Materials; and Materials at the Nanoscale -- Imaging, Electrochemistry & Electrical Properties.
"Nano Measure 2010 provides an excellent opportunity for researchers across a variety of disciplines to meet and discuss their work in a friendly, professional setting," said Jeff Jones, operations manager for Agilent's nanoinstrumentation facility in Chandler, Ariz.
Users of atomic force microscopes, nanomechanical test instrumentation, and all complementary nanomeasurement techniques and technologies are encouraged to submit original paper and poster abstracts. Each of the sessions will include guest speaker presentations and up to 10 oral papers selected from the submitted abstracts. The program will be augmented by a comprehensive poster session.
The Nano Measure 2010 symposium's keynote speaker is Emeritus Prof. Trevor Page (FREng) of the School of Chemical Engineering and Advanced Materials, Newcastle University, England. A former Head of Materials Engineering and Metallurgy at Newcastle, Dr. Page also was the University Pro-Vice-Chancellor for Research and External Affairs from 2000 to 2008 and currently holds the Cookson Group Chair of Materials Engineering.
Nano Measure 2010 session chairs are Prof., Dr. Peter Hinterdorfer, University of Linz, Austria; Dr. Sergei Magonov, Agilent Technologies; Drs. Warren Oliver and George Pharr, University of Tennessee-Knoxville, United States; and Prof. Dr. Marek Szymonski, Jagiellonian University. Additional information regarding registration for Nano Measure 2010, the submission of paper and poster abstracts, and symposium guest speakers is available at
About Agilent Atomic Force Microscopes and Nanomechanical Instruments
Agilent offers high-precision, modular nanomeasurement solutions for research, industry and education. Exceptional worldwide support is provided by experienced application scientists and technical service personnel. Our leading-edge R&D laboratories ensure the continued, timely introduction and optimization of innovative, easy-to-use nanomeasurement technologies.
Source: Agilent Technologies