Nanotechnology News – Latest Headlines

Atomic electrical field sensor using single diamond spins

Electrical fields play a pivotal role in numerous cases in both nature and technical areas: by changing the electrical field, impulses of nerves are transmitted and modern data storage operates by saving electrical charges the so-called Flash Memories. An ultra-precise reading of electrical fields, however, is still a challenge for physical measurement techniques. Researchers from the University of Stuttgart succeeded in measuring electrical fields with the aid of one single defect center in diamond.

Apr 19th, 2011

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Novel electrode for flexible thin-film solar cells

Conventional silicon-based rigid solar cells generally found on the market are not suitable for manufacturing moldable thin-film solar cells, in which a transparent, flexible and electrically conductive electrode collects the light and carries away the current. A woven polymer electrode developed by Empa has now produced first results which are very promising, indicating that the new material may be a substitute for indium tin oxide coatings.

Apr 19th, 2011

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ICE Publishing launches new flagship journal collection: ICE Science

ICE Publishing, the publishing division of the Institution of Civil Engineers, today announces the launch of a major new flagship journal series: ICE Science. By publishing at the intersection of many scientific disciplines this new series aims to inspire the cross-fertilization of ideas and drive forward knowledge in the areas of materials science, biomaterials, nanotechnology and energy.

Apr 18th, 2011

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Sensitive label-free DNA sensing based on metal/fluorophore interactions

With two recent studies, imec scientists contribute to the field of label-free DNA sensing. The measurement technique they have refined is based on the fact that metallic films and nanoparticles absorb the light of nearby light-emitting fluorophores. In one study, the quenching and enhancement of the emitted light was studied and quantified with a wide range of gold nanoparticles and DNA hairpin probes. In a second study and using similar probes, the technique was used to demonstrate a functional label-free genosensor.

Apr 18th, 2011

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Improved bulk FinFET fabrication process

A new process flow to fabricate FinFETs in bulk Si has shown significant advancements in critical FinFET fabrication steps. Key issue of the new fabrication method is the use of a plasma-free dry oxide removal process. FinFETs, obtained with this new integration scheme and co-integrated with planar CMOS in the same wafer, showed good morphological and electrical characteristics.

Apr 18th, 2011

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